Results
| Title: | Effects of burn-in stressing on radiation response of power VDMOSFETs | Authors: | Stojadinovic, Ninoslav D; Đoric-Veljkovic, Snezana M   ; Manic, Ivica Dj; Davidovic, Vojkan S ; Golubovic, Snezana M |
Issue Date: | 2002 | Publication: | Microelectronics journal | ISSN: | 0026-2692 Microelectronics Journal Search Idenfier |
Publisher: | United Kingdom : Elsevier BV | Type: | Article | Collation: | vol. 33 br. 11 str. 899-905 | DOI: | 10.1016/S0026-2692(02)00121-0 | WoS-ID: | 000179487900005 | Scopus-ID: | 2-s2.0-0036857943 | URI: | https://enauka.gov.rs/handle/123456789/830982 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 22M22 |
Items in eNauka are protected by copyright, with all rights reserved, unless otherwise indicated.