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| Title: | Analysis of gamma-irradiation induced degradation mechanisms in power VDMOSFETS | Authors: | Stojadinović, N.; Golubović, S.; Đorić, S.   ; Dimitrijev, S. |
Issue Date: | 1995 | Publication: | Microelectronics Reliability | ISSN: | 00262714 Microelectronics Reliability Search Idenfier |
Publisher: | United Kingdom : Elsevier BV | Type: | Article | Collation: | vol. 35 br. 3 str. 587-602 | DOI: | 10.1016/0026-2714(95)93077-N | Scopus-ID: | 2-s2.0-0029270861 | URI: | https://enauka.gov.rs/handle/123456789/875737 | Metadata source: | (Preuzeto iz CrossRef-a) Đorić-Veljković, Snežana | M-category: | Mp. category will be shown later |
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