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Separation of irradiation induced gate oxide charge and interface traps effects in power VDMOSFETs
| Title: | Separation of irradiation induced gate oxide charge and interface traps effects in power VDMOSFETs | Authors: | Stojadinović, N.; Đorić, S.   ; Davidović, V.; Golubović, S. |
Issue Date: | 1994 | Publication: | Electronics Letters | ISSN: | 0013-5194 Electronics Letters Search Idenfier |
Publisher: | United Kingdom : John Wiley & Sons Inc | Type: | Article | Collation: | vol. 30 br. 23 str. 1992-1993 | DOI: | 10.1049/el:19941309 | Scopus-ID: | 2-s2.0-0028549727 | URI: | https://enauka.gov.rs/handle/123456789/875739 | Metadata source: | (Preuzeto iz CrossRef-a) Đorić-Veljković, Snežana | M-category: | 21M21 |
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