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Effects of positive gate bias stressing and subsequent recovery treatment in power VDMOSFETs
| Title: | Effects of positive gate bias stressing and subsequent recovery treatment in power VDMOSFETs | Authors: | Stojadinovic, N.; Manic, I.; Đoric-Veljkovic, S.   ; Davidovic, V.; Golubovic, S.; Dimitrijev, S. |
Issue Date: | 2002 | Publication: | Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611) | Publisher: | Oranjestad, Netherlands : IEEE | Type: | Conference Paper | ISBN: | 0-7803-7380-4  Search Idenfier |
Collation: | str. D050-1-D050-8 | DOI: | 10.1109/ICCDCS.2002.1004073 | Scopus-ID: | 2-s2.0-84900315641 | URI: | https://enauka.gov.rs/handle/123456789/875779 | Metadata source: | (Preuzeto iz CrossRef-a) Đorić-Veljković, Snežana | M-category: | Mp. category will be shown later |
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