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Title: Modeling of radiation-induced mobility degradation in MOSFETs
Authors: Stojadinovic, N.; Golubovic, S.; Davidovic, V.; Đoric-Veljkovic, S.  ; Dimitrijev, S.
Issue Date: 1997
Publication: Proceedings of the International Conference on Microelectronics
Publisher: [New York] : Institute of Electrical and Electronics Engineers, Electron Devices Society
Type: Conference Paper
Collation: vol. 1 str. 355-356
Scopus-ID: 2-s2.0-0031363287
URI: https://enauka.gov.rs/handle/123456789/875784
URL: http://www.scopus.com/inward/record.url?eid=2-s2.0-0031363287&partnerID=MN8TOARS
Metadata source: (Preuzeto iz ORCID-a) Đorić-Veljković, Snežana
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