Analysis of gamma-irradiation induced oxide charge and interface trap effects in power VDMOSFETs

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Title:	Analysis of gamma-irradiation induced oxide charge and interface trap effects in power VDMOSFETs
Authors:	Đoric-Veljkovic, S. ; Davidovic, V.
Issue Date:	1995
Publication:	Proceedings of the International Conference on Microelectronics
Publisher:	Niš : IEEE
Type:	Conference Paper
ISBN:	0-7803-2786-1 Search Idenfier
Collation:	vol. 1 str. 259-262
DOI:	10.1109/ICMEL.1995.500876
Scopus-ID:	2-s2.0-0029492179
URI:	https://enauka.gov.rs/handle/123456789/875794
URL:	http://www.scopus.com/inward/record.url?eid=2-s2.0-0029492179&partnerID=MN8TOARS
Metadata source:	(Preuzeto iz ORCID-a) Đorić-Veljković, Snežana
M-category:	Mp. category will be shown later

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