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Negative bias temperature stress and annealing effects in p-channel power VDMOSFETs
| Title: | Negative bias temperature stress and annealing effects in p-channel power VDMOSFETs | Authors: | Dankovic, D.; Manic, I.; Davidovic, V.; Đoric-Veljkovic, S.   ; Golubovic, S.; Stojadinovic, N. |
Issue Date: | 2008 | Publication: | 9th International Seminar on Power Semiconductors (ISPS 2008) | Publisher: | Institution of Engineering and Technology | Type: | Conference Paper | ISBN: | 978-80-01-04139-0  Search Idenfier |
Collation: | str. 127-132 | DOI: | 10.1049/ic:20080225 | Scopus-ID: | 2-s2.0-67650529322 | URI: | https://enauka.gov.rs/handle/123456789/875801 | Metadata source: | (Preuzeto iz CrossRef-a) Đorić-Veljković, Snežana | M-category: | Mp. category will be shown later |
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