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| Title: | Characterisation of radiation response of 400 nm implanted gate oxide RADFETs | Authors: | Jakšić, Aleksandar; Ristić, Goran   ; Pejovic, Milić ; Mohammadzadeh, Ali; Lane, William |
Issue Date: | 2002 | Publication: | 2002 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings | Type: | Conference Paper | ISBN: | 0-7803-7235-2  Search Idenfier |
Collation: | vol. 2 str. 727-730 | DOI: | 10.1109/MIEL.2002.1003360 | Scopus-ID: | 2-s2.0-79955755558 | URI: | https://enauka.gov.rs/handle/123456789/881623 | Metadata source: | (Preuzeto iz ORCID-a) Ristić, Goran | M-category: | Mp. category will be shown later |
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