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| Title: | Temperature-induced rebound in Al-gate NMOS transistors | Authors: | Pejović, Momčilo  ; Golubović, Snežana ; Ristić, Goran  |
Issue Date: | 1995 | Publication: | IEE Proceedings: Circuits, Devices and Systems | ISSN: | 1350-2409 IEE Proceedings: Circuits Devices and Systems Search Idenfier |
Type: | Article | ISBN: | 1359-7000 ИСБН није валидан Search Idenfier |
Collation: | vol. 142 br. 6 str. 413-413 | DOI: | 10.1049/ip-cds:19952085 | Scopus-ID: | 2-s2.0-0029487355 | URI: | https://enauka.gov.rs/handle/123456789/881625 | Metadata source: | (Preuzeto iz ORCID-a) Ristić, Goran | M-category: | Mp. category will be shown later |
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