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Title: Post-irradiation behavior of commercial power VDMOSFETs
Authors: Jakšić, Aleksandar; Pejović, Momčilo ; Ristić, Goran  
Issue Date: 2000
Publication: 2000 22nd International Conference on Microelectronics, MIEL 2000 - Proceedings
Type: Conference Paper
ISBN: 0-7803-5235-1 Search Idenfier
Collation: vol. 1 str. 343-346
DOI: 10.1109/ICMEL.2000.840585
Scopus-ID: 2-s2.0-84906827953
URI: https://enauka.gov.rs/handle/123456789/881638
Metadata source: (Preuzeto iz ORCID-a) Ristić, Goran
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