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eNauka >  Results >  Creation and passivation of interface traps in irradiated MOS transistors during annealing at different temperatures
Title: Creation and passivation of interface traps in irradiated MOS transistors during annealing at different temperatures
Authors: Pejović, Momčilo ; Ristić, Goran  
Issue Date: 1997
Publication: Solid-State Electronics
ISSN: 0038-1101 Solid-state Electronics Search Idenfier
Type: Article
Collation: vol. 41 br. 5 str. 715-720
DOI: 10.1016/S0038-1101(96)00252-3
WoS-ID: A1997WZ80000009
Scopus-ID: 2-s2.0-0031140974
URI: https://enauka.gov.rs/handle/123456789/881648
Metadata source: (Preuzeto iz ORCID-a) Ristić, Goran
M-category: 
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