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eNauka >  Results >  Formation and passivation of interface traps in irradiated n-channel power VDMOSFETs during thermal annealing
Title: Formation and passivation of interface traps in irradiated n-channel power VDMOSFETs during thermal annealing
Authors: Pejović, Momčilo ; Ristić, Goran  ; Jakšić, Aleksandar
Issue Date: 1997
Publication: Applied Surface Science
ISSN: 0169-4332 Applied Surface Science Search Idenfier
Type: Article
Collation: vol. 108 br. 1 str. 141-148
DOI: 10.1016/S0169-4332(96)00573-9
WoS-ID: A1997WC30900019
Scopus-ID: 2-s2.0-0030737028
URI: https://enauka.gov.rs/handle/123456789/881650
Metadata source: (Preuzeto iz ORCID-a) Ristić, Goran
M-category: 
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