Results

eNauka >  Results >  Latent interface-trap generation during thermal annealing of γ-ray irradiated power VDMOSFETs
Title: Latent interface-trap generation during thermal annealing of γ-ray irradiated power VDMOSFETs
Authors: Jakšić, Aleksandar; Ristić, Goran  ; Pejovic, Momčilo 
Issue Date: 1995
Publication: Proceedings of the International Semiconductor Conference, CAS
Type: Conference Paper
Collation: str. 215-218
Scopus-ID: 2-s2.0-0029489789
URI: https://enauka.gov.rs/handle/123456789/881654
Metadata source: (Preuzeto iz ORCID-a) Ristić, Goran
M-category: 
Mp. category will be shown later

Find the DOI

Google ScholarTM

Items in eNauka are protected by copyright, with all rights reserved, unless otherwise indicated.