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Effect of radiation-induced oxide-trapped charge on mobility in p-channel MOSFETs
| Title: | Effect of radiation-induced oxide-trapped charge on mobility in p-channel MOSFETs | Authors: | Stojadinović, Ninoslav  ; Pejović, Momčilo ; Golubović, Snežana ; Ristić, Goran  ; Davidović, Vojkan ; Dimitrijev, Sima |
Issue Date: | 1995 | Publication: | Electronics Letters | ISSN: | 0013-5194 Electronics Letters Search Idenfier |
Type: | Article | Collation: | vol. 31 br. 6 str. 497-498 | DOI: | 10.1049/el:19950302 | Scopus-ID: | 2-s2.0-0029274848 | URI: | https://enauka.gov.rs/handle/123456789/881667 | Metadata source: | (Preuzeto iz ORCID-a) Ristić, Goran | M-category: | Mp. category will be shown later |
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