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Gate oxide degradation of electronic components due to irradiation and bias temperature stress
| Title: | Gate oxide degradation of electronic components due to irradiation and bias temperature stress | Authors: | Veljković, Sandra   ; Mitrović, Nikola ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Golubović, Snežana ; Danković, Danijel |
Issue Date: | 2021 | Publication: | Advanced Ceramics and Applications IX, Belgrade, Serbia, 20-21 September 2021, p. 62 | Type: | Conference Paper | ISBN: | 978-86-915627-8-6  Search Idenfier |
URI: | https://enauka.gov.rs/handle/123456789/889049 | URL: | http://www.serbianceramicsociety.rs/doc/aca01-10/aca9/ACA-IX-2021-Book-of-Abstracts.pdf | Metadata source: | (Preuzeto iz ORCID-a) Veljković, Sandra | M-category: | Mp. category will be shown later |
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