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eNauka >  Results >  Defect Modeling During the SLM Process for Manufacturing Microwave Devices
Title: Defect Modeling During the SLM Process for Manufacturing Microwave Devices
Authors: Li, Shuai; Bao, Xiue; Gugliandolo, Giovanni; Yuan, Haoyun; Li, Jinkai; Shao, Linxiang; Du, Minghe; Donato, Nicola; Marinković, Zlatica  ; Crupi, Giovanni;
Fang, Lili; Si, Liming; Sun, Houjun;
Issue Date: 2023
Publication: 2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
Type: Conference Paper
ISBN: 979-8-3503-0080-2 Search Idenfier
Collation: str. 412-416
DOI: 10.1109/MetroXRAINE58569.2023.10405715
Scopus-ID: 2-s2.0-85185821635
URI: https://enauka.gov.rs/handle/123456789/889114
Metadata source: (Preuzeto iz CrossRef-a) Marinković, Zlatica
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