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Using TCAD Simulations to Verify the McWhorter Method for Assessing Trapped Charge in Dielectric
| Title: | Using TCAD Simulations to Verify the McWhorter Method for Assessing Trapped Charge in Dielectric | Authors: | Veljković, Sandra   ; Ristić, Goran ; Danković, Danijel ; Palma, Alberto; Andjelković, Marko ; Duane, Russell |
Issue Date: | 2023 | Publication: | 2023 IEEE 33rd International Conference on Microelectronics (MIEL) | Type: | Conference Paper | ISBN: | 979-8-3503-4776-0  Search Idenfier |
Collation: | str. 1-4 | DOI: | 10.1109/MIEL58498.2023.10315943 | WoS-ID: | 001701718400043 | Scopus-ID: | 2-s2.0-85183085836 | URI: | https://enauka.gov.rs/handle/123456789/889216 | Metadata source: | (Preuzeto iz CrossRef-a) Danković, Danijel | M-category: | Mp. category will be shown later |
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