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Characterization of Growth and Real Structure of Nitride Based Semiconductor Devices by Use of Synchrotron Radiation
| Title: | Characterization of Growth and Real Structure of Nitride Based Semiconductor Devices by Use of Synchrotron Radiation | Authors: | Miljević, Bojan   |
Supervisor: | Gerd Tilo Baumbach | Issue Date: | 2012 | Publisher: | Karlsruher: Karlsruher Institut für Technologie (KIT) | Type: | Doctoral theses | Collation: | str. 1-163 | DOI: | 10.5445/IR/1000030281 | URI: | https://enauka.gov.rs/handle/123456789/891558 | Metadata source: | (Preuzeto iz ORCID-a) Miljević, Bojan | M-category: | 70M70 |
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