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Characterization of Growth and Real Structure of Nitride Based Semiconductor Devices by Use of Synchrotron Radiation
| Naziv: | Characterization of Growth and Real Structure of Nitride Based Semiconductor Devices by Use of Synchrotron Radiation | Autori: | Miljević, Bojan   |
Mentor: | Gerd Tilo Baumbach | Godina: | 2012 | Izdavač: | Karlsruher: Karlsruher Institut für Technologie (KIT) | Tip rezultata: | Doktorska disertacija | Kolacija: | str. 1-163 | DOI: | 10.5445/IR/1000030281 | URI: | https://enauka.gov.rs/handle/123456789/891558 | Izvor metapodataka: | (Preuzeto iz ORCID-a) Miljević, Bojan | M-kategorija: | 70M70 - Odbranjena doktorska disertacija |
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