Spectroscopic ellipsometry and atomic force microscopy characterization of ultrathin dielectric films prepared via layer-bylayer polyelectrolyte deposition

Nedić, Stanko; Aškrabić, Sonja; Vasić, Borislav; Isić, Goran; Ralević, Uroš

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eNauka > Results > Spectroscopic ellipsometry and atomic force microscopy characterization of ultrathin dielectric films prepared via layer-bylayer polyelectrolyte deposition

Title:	Spectroscopic ellipsometry and atomic force microscopy characterization of ultrathin dielectric films prepared via layer-bylayer polyelectrolyte deposition
Authors:	Nedić, Stanko ; Aškrabić, Sonja ; Vasić, Borislav ; Isić, Goran ; Ralević, Uroš
Issue Date:	2022
Publication:	International Conference on Nanosciences and Nanotechnologies (NN22)
Type:	Other
URI:	https://enauka.gov.rs/handle/123456789/903980
URL:	https://www.nanotexnology.com/2022/images/stories/food/NN22_PROGRAM.pdf
Metadata source:	(Preuzeto iz ORCID-a) Nedić, Stanko
M-category:	Mp. category will be shown later

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