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A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress
| Title: | A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress | Authors: | Živanović, Emilija   ; Veljković, Sandra ; Mitrović, Nikola ; Jovanović, Igor ; Đorić Veljković, Snežana ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel |
Issue Date: | 2024 | Publication: | Micromachines | ISSN: | 2072-666X Micromachines Search Idenfier |
Publisher: | MDPI | Type: | Article | Collation: | vol. 15 br. 4 str. 503-503 | DOI: | 10.3390/mi15040503 | WoS-ID: | 001209924900001 | Scopus-ID: | 2-s2.0-85191376010 | URI: | https://enauka.gov.rs/handle/123456789/905124 | Project: | Serbian Ministry of Science, Technological Development and Innovation | Metadata source: | (Preuzeto iz CrossRef-a) Jovanović, Igor | M-category: | 21M21 |
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