"Point-by-point" inversion vs. parametrized fitting of ultrathin film's dielectric function measured by rotating polarizer ellipsometry

Jakovljević, Milka M.; Aškrabić, Sonja; M. Artemyev; A. V. Prudnikau; A. V. Antanovich; Isić, Goran; Vasić, Borislav; Ralević, Uroš; Dohčević-Mitrović, Zorana; Gajić, Radoš

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eNauka > Results > "Point-by-point" inversion vs. parametrized fitting of ultrathin film's dielectric function measured by rotating polarizer ellipsometry

Title:	"Point-by-point" inversion vs. parametrized fitting of ultrathin film's dielectric function measured by rotating polarizer ellipsometry
Authors:	Jakovljević, Milka M.; Aškrabić, Sonja ; M. Artemyev; A. V. Prudnikau; A. V. Antanovich; Isić, Goran ; Vasić, Borislav ; Ralević, Uroš ; Dohčević-Mitrović, Zorana ; Gajić, Radoš
Issue Date:	2019
Publication:	VII International School and Conference on Photonics - PHOTONICA2019
Type:	Conference Paper
ISBN:	978-86-7306-153-5 Search Idenfier
URI:	https://enauka.gov.rs/handle/123456789/905392
URL:	http://www.photonica.ac.rs/docs/PHOTONICA2019-Book_of_abstracts.pdf
Metadata source:	(Preuzeto iz ORCID-a) Isić, Goran
M-category:	Mp. category will be shown later

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