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The Influence of Neutron and Gamma Radiation on the Reliability of Magnetic and Semiconductor Memories
| Title: | The Influence of Neutron and Gamma Radiation on the Reliability of Magnetic and Semiconductor Memories | Authors: | Kartalović, Nenad   ; Kovačević, Uroš ; Nikezić, Dušan ; Osmokrović, Predrag |
Issue Date: | 2024 | Publication: | Nuclear Technology and Radiation Protection | ISSN: | 1451-3994 Nuclear technology and radiation protection Search Idenfier |
Type: | Article | Collation: | vol. 39 br. 1 str. 21-28 | DOI: | 10.2298/NTRP2401021K | WoS-ID: | 001279090600003 | Scopus-ID: | 2-s2.0-85206378359 | URI: | https://vinar.vin.bg.ac.rs/handle/123456789/13847 https://enauka.gov.rs/handle/123456789/936808 |
Project: | Ministarstvo nauke, tehnološkog razvoja i inovacija Republike Srbije, institucionalno finansiranje - 200017 (Univerzitet u Beogradu, Institut za nuklearne nauke Vinča, Beograd-Vinča) | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 22M22 |
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