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Impact of Trapped Charge on the Breakdown Phenomena in HfO2/Al2O3 — Based Memory Capacitors
| Title: | Impact of Trapped Charge on the Breakdown Phenomena in HfO2/Al2O3 — Based Memory Capacitors | Authors: | Spassov, D.; Paskaleva, A.; Guziewicz, E.; Ivanov, Tz.; Stanchev, T.; Davidović, Vojkan   ; Veljković, Sandra ; Mitrović, Nikola ; Danković, Danijel |
Issue Date: | 2024 | Publication: | Journal of Circuits, Systems and Computers | ISSN: | 0218-1266 Journal of Circuits Systems and Computers Search Idenfier |
Type: | Article | DOI: | 10.1142/S0218126625410038 | WoS-ID: | 001379642700001 | Scopus-ID: | 2-s2.0-85212847155 | URI: | https://enauka.gov.rs/handle/123456789/958744 | Metadata source: | (Preuzeto iz CrossRef-a) Veljković, Sandra | Availability note: | Пуни текст није јавно доступан | M-category: | 22M22 |
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