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Stress-induced Degradations and Self-heating Effects in P-channel Power VDMOS Transistors
| Title: | Stress-induced Degradations and Self-heating Effects in P-channel Power VDMOS Transistors | Authors: | Veljković, Sandra   ; Mitrović, Nikola ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel |
Issue Date: | 2024 | Publication: | Proceedings SAUM 2024 | Type: | Conference Paper | ISBN: | 978-86-6125-282-2  Search Idenfier |
Collation: | str. 125-128 | DOI: | 10.46793/SAUM24.125V | URI: | https://enauka.gov.rs/handle/123456789/958749 | Metadata source: | (Preuzeto iz CrossRef-a) Veljković, Sandra | M-category: | Mp. category will be shown later |
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