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A relationship between structural characteristics and noise properties of thick resistive films
| Title: | A relationship between structural characteristics and noise properties of thick resistive films | Authors: | Stanimirović, Ivanka   ; Jevtić, M.M.; Stanimirović, Zdravko |
Issue Date: | 2000 | Publication: | MIEL : 22nd International Conference on Microelectronics : Proceedings | Publisher: | IEEE | Type: | Conference Paper | ISBN: | 0-7803-5235-1  Search Idenfier |
Collation: | vol. 2 str. 521-524 | DOI: | 10.1109/ICMEL.2000.838745 | URI: | https://vinar.vin.bg.ac.rs/handle/123456789/14381 https://enauka.gov.rs/handle/123456789/967428 |
Availability note: | Пуни текст није доступан ни у електронској, ни у штампаној форми | M-category: | Mp. category will be shown later |
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