Rezultati
| Title: | EBS/C impurity and damage profiling of 4 MeV C implanted MgF2 single crystal | Authors: | Gloginjić, Marko   ; Erich, Marko ; Kokkoris, M.; Chen, S.; Fazinić, S.; Karlušić, M.; Rajić, Vladimir ; Kirilkin, N.; Skuratov, V.; Petrović, Srđan M. |
Issue Date: | 2025 | Publication: | Materials Science in Semiconductor Processing | ISSN: | 1369-8001 Materials Science in Semiconductor Processing Search Idenfier |
Type: | Article | Collation: | vol. 199 str. 109865-109865 | DOI: | 10.1016/j.mssp.2025.109865 | WoS-ID: | 001534607600002 | Scopus-ID: | 2-s2.0-105010471261 | URI: | https://vinar.vin.bg.ac.rs/handle/123456789/15182 https://enauka.gov.rs/handle/123456789/990649 |
Project: | Joint Institute for Nuclear Research collaboration [project “The condensed matter physics with ion beams”] European Union's Horizon 2020 [824096 RADIATE] |
M-category: | 21M21 |
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