| Issue Date | Title | Author(s) | Type | Мp-cat. |
| 2001 | A method for VCO phase noise analysis | Simic, D; Hadzi-Vukovic, Jovan M; Jevtic, Milan M | Conference Paper | |
| 2002 | An alternative method for transistor low frequency noise estimation by measuring phase noise of test oscillator | Jevtic, Milan M; Hadzi-Vukovic, Jovan M; Ramovic, Rifat M | Article | |
| 2007 | Diagnostics of GaAsHEMT based on noise measurements | Jevtic, Milan M; Hadzi-Vukovic, Jovan M | Article | |
| 2009 | Low frequency noise as a tool for diagnostic of ESD degraded GaAs mesfets | Jevtic, Milan M; Hadzi-Vukovic, Jovan M | Article | |
| 2006 | Low frequency noise of GaAs MESFET degraded in ESD test | Jevtic, Milan M; Hadzi-Vukovic, Jovan M | Conference Paper | |
| 2005 | Pulse voltage stress degradation of 4H-SiC Schottky diodes studied by I-V and noise measurements | Jevtic, Milan M; Hadzi-Vukovic, Jovan M; Dinu, Dan | Conference Paper | |
| 2007 | Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements | Jevtic, Milan M; Hadzi-Vukovic, Jovan M | Article | |
| 2008 | The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements | Hadzi-Vukovic, Jovan M; Jevtic, Milan M; Glavanovics, M; Rothleitner, H | Conference Paper | |
| 2005 | The study of PMOS V-th distribution using process and device Simulations and C-V measurements | Hadzi-Vukovic, Jovan M; Jevtic, Milan M | Conference Paper | |
| 2007 | The voltage pulse degraded Ti/4H-SiC Schottky diodes studied with I-V and low frequency noise measurements | Hadzi-Vukovic, Jovan M; Jevtic, Milan M | Article | |