eNauka - pregled
Pregled prema Autor Hadzi-Vukovic, Jovan M
Prikaz rezultata 1 do 10 od 10
| Godina | Naslov | Autor(i) | Tip rezultata | Mp-kat. |
|---|---|---|---|---|
| 2001 | A method for VCO phase noise analysis | Simic, D; Hadzi-Vukovic, Jovan M; Jevtic, Milan M | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
| 2002 | An alternative method for transistor low frequency noise estimation by measuring phase noise of test oscillator | Jevtic, Milan M; Hadzi-Vukovic, Jovan M; Ramovic, Rifat M | Naučni članak | 22M22 - Međunarodni časopis kategorije M22 |
| 2007 | Diagnostics of GaAsHEMT based on noise measurements | Jevtic, Milan M; Hadzi-Vukovic, Jovan M | Naučni članak | 22M22 - Međunarodni časopis kategorije M22 |
| 2009 | Low frequency noise as a tool for diagnostic of ESD degraded GaAs mesfets | Jevtic, Milan M; Hadzi-Vukovic, Jovan M | Naučni članak | 22M22 - Međunarodni časopis kategorije M22 |
| 2006 | Low frequency noise of GaAs MESFET degraded in ESD test | Jevtic, Milan M; Hadzi-Vukovic, Jovan M | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
| 2005 | Pulse voltage stress degradation of 4H-SiC Schottky diodes studied by I-V and noise measurements | Jevtic, Milan M; Hadzi-Vukovic, Jovan M; Dinu, Dan | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
| 2007 | Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurements | Jevtic, Milan M; Hadzi-Vukovic, Jovan M | Naučni članak | 22M22 - Međunarodni časopis kategorije M22 |
| 2008 | The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurements | Hadzi-Vukovic, Jovan M; Jevtic, Milan M; Glavanovics, M; Rothleitner, H | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
| 2005 | The study of PMOS V-th distribution using process and device Simulations and C-V measurements | Hadzi-Vukovic, Jovan M; Jevtic, Milan M | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
| 2007 | The voltage pulse degraded Ti/4H-SiC Schottky diodes studied with I-V and low frequency noise measurements | Hadzi-Vukovic, Jovan M; Jevtic, Milan M | Naučni članak | 21M21 - Vodeći međunarodni časopis kategorije M21 |