Browsing eNauka

Browsing by Author Hadzi-Vukovic, Jovan M

Showing results 1 to 10 of 10
Issue DateTitleAuthor(s)TypeМp-cat.
2001A method for VCO phase noise analysisSimic, D; Hadzi-Vukovic, Jovan M; Jevtic, Milan MConference Paper
Mp. category will be shown later
2002An alternative method for transistor low frequency noise estimation by measuring phase noise of test oscillatorJevtic, Milan M; Hadzi-Vukovic, Jovan M; Ramovic, Rifat MArticle
22M22
2007Diagnostics of GaAsHEMT based on noise measurementsJevtic, Milan M; Hadzi-Vukovic, Jovan MArticle
22M22
2009Low frequency noise as a tool for diagnostic of ESD degraded GaAs mesfetsJevtic, Milan M; Hadzi-Vukovic, Jovan MArticle
22M22
2006Low frequency noise of GaAs MESFET degraded in ESD testJevtic, Milan M; Hadzi-Vukovic, Jovan MConference Paper
Mp. category will be shown later
2005Pulse voltage stress degradation of 4H-SiC Schottky diodes studied by I-V and noise measurementsJevtic, Milan M; Hadzi-Vukovic, Jovan M; Dinu, DanConference Paper
Mp. category will be shown later
2007Study of the electrical cycling stressed large area Schottky diodes using I-V and noise measurementsJevtic, Milan M; Hadzi-Vukovic, Jovan MArticle
22M22
2008The study of ESD induced defects in smart power ESD protection circuits using low frequency noise measurementsHadzi-Vukovic, Jovan M; Jevtic, Milan M; Glavanovics, M; Rothleitner, HConference Paper
Mp. category will be shown later
2005The study of PMOS V-th distribution using process and device Simulations and C-V measurementsHadzi-Vukovic, Jovan M; Jevtic, Milan MConference Paper
Mp. category will be shown later
2007The voltage pulse degraded Ti/4H-SiC Schottky diodes studied with I-V and low frequency noise measurementsHadzi-Vukovic, Jovan M; Jevtic, Milan MArticle
21M21