Researchers
Golubović, Snežana
Results 61-71 of 71
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 1995 | Analiza formiranja i odžarivanja radijacionih defekata kod MOS tranzistora | Golubović, Snežana  | Doctoral theses | 70M70 |
| 1995 | Sensitivity and fading of pMOS dosimeters with thick gate oxide | Ristić, Goran  ; Golubović, Snežana ; Pejović, Momčilo | Article | Mp. category will be shown later |
| 1994 | Temperature and gate bias effects on gamma-irradiated Al-gate metal-oxide-semiconductor transistors | Pejović, Momčilo ; Golubović, Snežana ; Ristić, Goran ; Odalović, Milan | Article | 21M21 |
| 1994 | pMOS dosimeter with two-layer gate oxide operated at zero and negative bias | Ristić, Goran ; Golubović, Snežana ; Pejović, Momčilo | Article | 21M21 |
| 1994 | Annealing of gamma-irradiated Al-gate NMOS transistors | Pejović, Momčilo ; Golubović, Snežana ; Ristić, Goran ; Odalović, Milan | Article | 21M21 |
| 1994 | The role of interface traps in rebound mechanisms | Golubović, Snežana ; Ristić, Goran ; Pejović, Momčilo ; Dimitrijev, Sima | Article | 23M23 |
| 1993 | pMOS transistors for dosimetric application | Ristić, Goran ; Golubović, Snežana ; Pejović, Momčilo | Article | 21M21 |
| 1993 | A comparison between thermal annealing and UV‐radiation annealing of γ‐irradiated NMOS transistors | Pejović, Momčilo ; Ristić, Goran ; Golubović, Snežana | Article | 23M23 |
| 1992 | Opšti kurs fizike - zbirka rešenih zadataka | Pejović, Momčilo M. ; Župac, Dragan; Golubović, Snežana ; Jovanović, Tatjana ; Ristić, Goran S. | Encyclopedia entries | Mp. category will be shown later |
| 1989 | Zbirka rešenih zadataka iz fizike | Pejović, Momčilo M.; Golubović, Snežana ; Župac, Dragan | Text book | Mp. category will be shown later |
| 1987 | Zbirka rešenih zadataka iz fizike | Pejović, Momčilo M.; Golubović, Snežana | Text book | Mp. category will be shown later |