Истраживачи
Danković, Danijel
Results 141-160 of 183
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2014 | Measurement of NBTI Degradation in p-channel Power VDMOSFETs | Manić, Ivica Đ.   ; Danković, Danijel ; Prijić, Aneta ; Prijić, Zoran ; Stojadinović, Ninoslav D. | Article | 23M23 |
| 2014 | A Method for Measuring NBTI Degradation in p-channel Power VDMOSFETs | Prijić, Zoran ; Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2014 | On the Measurement Methods for Dielectric Constant Determination in Nb/BaTiO3 Ceramics | Marjanović, Miloš B. ; Paunović, Vesna V. ; Prijić, Zoran ; Prijić, Aneta ; Danković, Danijel ; Mitić, Vojislav | Conference Paper | Mp. category will be shown later |
| 2014 | Mobilna eksperimentalna postavka za određivanje napona praga VDMOS tranzistora snage | Aleksandar Ilić; Prijić, Zoran ; Prijić, Aneta ; Davidović, Vojkan ; Danković, Danijel ; Stojadinović, Ninoslav D. | Conference Paper | Mp. category will be shown later |
| 2014 | Recoverable and Permanent Components of V-T Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs | Danković, Danijel ; Stojadinović, Ninoslav ; Prijić, Zoran ; Manić, Ivica ; Prijić, Aneta | Conference Paper | Mp. category will be shown later |
| 2014 | Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors | Stojadinović, Ninoslav ; Manić, Ivica ; Danković, Danijel ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Prijić, Aneta ; Golubović, Snežana ; Prijić, Zoran | Book parts | Mp. category will be shown later |
| 2013 | IEEESTEC Student Conference Enjoys Sponsorship of Local EDS-SSCS Chapters and IEEE Serbia and Montenegro Section [Chapters] | Danković, Danijel | Article | Mp. category will be shown later |
| 2013 | An Electromechanical Approach to a Printed Circuit Board Design Course | Danković, Danijel ; Vračar, Ljubomir ; Prijić, Aneta ; Prijić, Zoran | Article | 22M22 |
| 2013 | The Importance of the IEEESTEC Students Projects Confernce | Danković, Danijel ; Marjanović, Miloš B. | Conference Paper | Mp. category will be shown later |
| 2013 | The Comparison of Gamma-Radiation and Electrical Stress Influences on Oxide and Interface Defects in Power Vdmosfet | Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2013 | Naponsko temperaturna naprezanja p-kanalnih VDMOS tranzistora snage | Danković, Danijel ; Prijić, Aneta ; Manić, Ivica Đ. ; Prijić, Zoran ; Stojadinović, Ninoslav D. | Conference Paper | Mp. category will be shown later |
| 2013 | Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav | Article | 23M23 |
| 2013 | Uticaj odžarivanja na oporavak električno naprezanih p-kanalnih VDMOS tranzistora snage | Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2012 | Lifetime estimation in nbt-stressed p-channel power VDMOSFETS | Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav | Article | 53M53 |
| 2012 | Nova metoda za ispitivanje nestabilnosti usled naponsko temperaturnih naprezanja VDMOS tranzistora snage | Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Vračar, Ljubomir M. ; Prijić, Zoran ; Stojadinović, Ninoslav | Technical reports | Mp. category will be shown later |
| 2012 | Measurements of Negative Bias Temperature Instability (NBTI) in p-Channel Power VDMOSFETs | Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Prijić, Zoran ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2012 | Modelovanje napona praga p-kanalnih VDMOS tranzistora snage tokom naponsko temperaturnih naprezanja i odžarivanja | Manić, Ivica ; Danković, Danijel ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2012 | Određivanje perioda pouzdanog rada p-kanalnih VDMOS tranzistora snage podvrgnutih kontinualnim i impulsnim NBT naprezanjima | Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Davidović, Vojkan ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav ; Đorić-Veljković, Snežana | Conference Paper | Mp. category will be shown later |
| 2012 | A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors | Prijić, Aneta ; Danković, Danijel ; Vračar, Ljubomir ; Manić, Ivica ; Prijić, Zoran ; Stojadinović, Ninoslav | Article | 21M21 |
| 2012 | 28th International Conference on Microelectronics Sponsored by SSCS-Serbia/Montenegro Chapters in May: Over 100 Converge from 22 Countries; Nearly 100 Papers [Chapters] | Stojadinović, Ninoslav ; Danković, Danijel | Article | Mp. category will be shown later |