Researchers



Results 61-68 of 68
Issue DateTitleAuthor(s)TypeМp-cat.
2004An improved analytical model of IGBT in forward conduction modePavlovic, Zoran; Manic, Ivica Dj  ; Stojadinovic, Ninoslav DConference Paper
Mp. category will be shown later
2003Effects of electrical stressing in power VDMOSFETsStojadinović, Ninoslav ; Manić, Ivica  ; Davidović, Vojkan  ; Danković, Danijel  ; Đorić Veljković, Snežana  ; Golubović, Snežana ; Dimitrijev, SimaConference Paper
Mp. category will be shown later
2002Effects of ?-Irradiation on Electrical Characteristics of Power Vdmos TransistorsPavlović, Z.; Manić, Ivica  ; Golubović, SnežanaArticle
Mp. category will be shown later
2002Spontaneous recovery of positive gate bias stressed power VDMOSFETsStojadinović, Ninoslav ; Manić, Ivica  ; Đorić Veljković, Snežana  ; Davidović, Vojkan  ; Danković, Danijel  ; Golubović, Snežana ; Dimitrijev, SimaConference Paper
Mp. category will be shown later
2002Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETsStojadinović, Ninoslav ; Manić, Ivica  ; Đorić Veljković, Snežana  ; Davidović, Vojkan  ; Danković, Danijel  ; Golubović, Snežana ; Dimitrijev, SimaArticle
22M22
2001Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETsStojadinovic, Ninoslav D; Manic, Ivica Dj  ; Đoric-Veljkovic, Snezana M  ; Davidovic, Vojkan S  ; Golubovic, Snezana M; Dimitrijev, SimaArticle
22M22
2001Analytical modelling of electrical characteristics in gamma-irradiated power VDMOS transistorsManić, Ivica  ; Pavlović, Zoran; Prijić, Zoran  ; Davidović, Vojkan  ; Stojadinović, Ninoslav Article
22M22
1999General analytical solution to the minority carrier current density in low-high junctionsRistić, Stojan; Manić, Ivica  ; Prijić, Zoran  ; Prijić, Aneta  Conference Paper
Mp. category will be shown later