| Issue Date | Title | Author(s) | Type | Мp-cat. |
| 2011 | Realizacija dva pojačavača na bazi integracionog pojačanja za merenje niskih nivoa jednosmernih struja u dozimetrijskim aplikacijama | Jovanović, Uglješa   ; Anđelković, Marko ; Ristić, Goran | Conference Paper | |
| 2011 | Interface and oxide state behaviors of commercial n-channel power MOSFETs during high electric field stress and thermal annealing at 150 °C | Ristić, Goran ; Vasović, Nikola D | Article | |
| 2011 | Comparative Analysis of Two Techniques for Measuring Low Level Photocurrents | Anđelković, Marko ; Ristić, Goran ; Jovanović, Uglješa | Conference Paper | |
| 2011 | Realizacija dva pojačavača na bazi transimpedansnog pojačanja za merenje niskih nivoa jednosmernih struja u dozimetrijskim aplikacijama | Jovanović, Uglješa ; Anđelković, Marko ; Ristić, Goran | Conference Paper | |
| 2011 | The sensitivity of 100 nm RADFETs with zero gate bias up to dose of 230 Gy(Si) | Ristic, Goran S. ; Vasovic, Nikola D.; Kovačević, Milojko; Jaksic, Aleksandar B. | Article | |
| 2011 | Realization of a Current Integrating Picoampermeter | Marko Anđelković; Ristić, Goran | Conference Paper | |
| 2011 | Numerical solution of the transport equation describing the radon transport from subsurface soil to buildings | Savović, Svetislav ; Djordjevich, A.; Ristić, Goran | Article | |
| 2010 | Effect of fluorination and hydrogenation by ion implantation on reliability of poly-Si TFTs under gamma irradiation | Jelenković, Emil V; Ristić, Goran ; Pejović, Milić ; Jevtić, Milan M; Jha, Shrawan K; Videnović-Mišić, Mirjana ; Pejović, Momčilo ; Tong, K Y | Article | |
| 2009 | Stability of submicron AlGaN/GaN HEMT devices irradiated by gamma rays | Jha, Shrawan K; Jelenkovic, Emil V; Pejovic, Milic M ; Ristic, Goran S ; Pejovic, Momcilo M; Tong, KY; Surya, C; Bello, I; Zhang, WJ | Article | |
| 2009 | Thermal and UV annealing of irradiated pMOS dosimetric transistors | Ristic, Goran S | Article | |
| 2008 | Influence of ionizing radiation and hot carrier injection on metal-oxide-semiconductor transistors | Ristic, Goran S | Article | |
| 2008 | Analysis of neutral active particle loss in afterglow in krypton at 2.6mbar pressure | Pejovic, Momcilo M.; Karamarkovic, Jugoslav P. ; Ristic, Goran S. ; Pejovic, Milic M. | Article | |
| 2008 | Modelling of time delay of electrical breakdown for nitrogen-filled tubes at pressures of 6.6 and 13.3 mbar in the increase region of the memory curve | Nesic, N T; Ristic, G S ; Karamarkovic, J P ; Pejovic, M M | Article | |
| 2007 | Physico-chemical processes in metal-oxide-semiconductor transistors with thick gate oxide during high electric field stress | Ristic, Goran S ; Pejovic, Momcilo M; Jaksic, Aleksandar B | Article | |
| 2006 | Screen optics effects on detective quantum efficiency in digital radiography: Zero-frequency effects | Lubinsky, Anthony; Zhao, Wei; Ristić, Goran ; Rowlands, John | Article | |
| 2006 | Defect behaviors in n-channel power VDMOSFETs during HEFS and thermal post-HEFS annealing | Ristic, Goran S ; Pejovic, Momcilo M; Jaksic, Aleksandar B | Article | |
| 2005 | Fowler-Nordheim high electric field stress of power VDMOSFETs | Ristic, Goran S ; Pejovic, Momcilo M; Jaksic, Aleksandar B | Article | |
| 2005 | Gamma and UV radiation effects on breakdown voltage of neon-filled tube | Pejovic, Milic M ; Pejovic, Momcilo M; Ristic, Goran S | Article | |
| 2004 | X-ray imaging performance of structured cesium iodide scintillators | Zhao, Wei; Ristić, Goran ; Rowlands, John | Article | |
| 2004 | Inherent imaging performance of cesium iodide scintillators | Zhao, Wei; Ristić, Goran ; Rowlands, John | Conference Paper | |
Ristić, Goran
