Results
| Title: | Stoichiometric SiO2 thin films deposited by reactive sputtering | Authors: | Radović, Ivan |
Issue Date: | 2007 | Publication: | Materials Chemistry and Physics | ISSN: | 0254-0584 Materials Chemistry and Physics Search Idenfier |
Type: | Article | Collation: | vol. 104 br. 1 str. 172-176 | DOI: | 10.1016/j.matchemphys.2007.03.006 | WoS-ID: | 000247862200030 | Scopus-ID: | 2-s2.0-34249847586 | URI: | https://plus.cobiss.net/cobiss/sr/sr/bib/1025950645#izum.si https://vinar.vin.bg.ac.rs/handle/123456789/3208 https://enauka.gov.rs/handle/123456789/244282 |
Project: | Ministry of Foreign Affairs (in the frame of the COCOP) of the Republic of France French Atomic Energy Commission (CEA) Ministry of Science and Environmental Protection of the Republic of Serbia |
M-category: | 21M21 |
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