Point-by-point inversion vs. parametrized fitting of ultrathin films dielectric function measured by rotating polarizer ellipsometry

Jakovljević, Milka M.; Aškrabić, Sonja M.; M Artemyev; AV Prudnikau; AV Antanovich; Isić, Goran M.; Vasić, Borislav Z.; U Ralević; Dohčević-Mitrović, Zorana D.; Gajić, Radoš B.

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Title:	Point-by-point inversion vs. parametrized fitting of ultrathin films dielectric function measured by rotating polarizer ellipsometry
Authors:	Jakovljević, Milka M. ; Aškrabić, Sonja M. ; M Artemyev; AV Prudnikau; AV Antanovich; Isić, Goran M. ; Vasić, Borislav Z. ; U Ralević; Dohčević-Mitrović, Zorana D. ; Gajić, Radoš B.
Issue Date:	2019
Publication:	Photonica2019: 7th International School and conference on Photonics
Publisher:	Institut za nuklearne nauke VINČA, Beograd
Type:	Conference Paper
ISBN:	978-86-7306-153-5 Search Idenfier
URI:	https://enauka.gov.rs/handle/123456789/309100
Metadata source:	Migrirano iz RIS podataka
M-category:	Mp. category will be shown later

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