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Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors
| Title: | Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors | Authors  : | Stojadinović, Ninoslav  ; Manić, Ivica  ; Danković, Danijel ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Prijić, Aneta ; Golubović, Snežana ; Prijić, Zoran |
Issue Date: | 2014 | Publication: | Bias Temperature Instability for Devices and Circuits | Publisher: | New York : Springer Science+Business Media | Type: | Book parts | ISBN: | 978-1-4614-7908-6  Search Idenfier |
Collation: | str. 533-559 | DOI: | 10.1007/978-1-4614-7909-3 | Scopus-ID: | 2-s2.0-84929643602 | URI: | https://enauka.gov.rs/handle/123456789/322176 | Metadata source: | Migrirano iz RIS podataka | M-category: | Mp. category will be shown later |
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