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| Title: | Radiation hardening of power MOSFETs using electrical stress | Authors: | Stojadinovic, Ninoslav D; Đoric-Veljkovic, Snezana M   ; Manic, Ivica Dj; Davidovic, Vojkan S ; Golubovic, Snezana M |
Issue Date: | 2002 | Publication: | Electronics Letters | ISSN: | 0013-5194 Electronics Letters Search Idenfier |
Publisher: | United Kingdom : Institution of Engineering and Technology | Type: | Article | Collation: | vol. 38 br. 9 str. 431-431 | DOI: | 10.1049/el:20020281 | WoS-ID: | 000175537700025 | Scopus-ID: | 2-s2.0-0037171898 | URI: | https://enauka.gov.rs/handle/123456789/799838 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | 21M21 |
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