Резултати
eNauka >
Rezultati >
Pulse voltage stress degradation of 4H-SiC Schottky diodes studied by I-V and noise measurements
| Title: | Pulse voltage stress degradation of 4H-SiC Schottky diodes studied by I-V and noise measurements | Authors: | Jevtic, Milan M; Hadzi-Vukovic, Jovan M; Dinu, Dan | Issue Date: | 2005 | Publication: | CAS 2005: INTERNATIONAL SEMICONDUCTOR CONFERENCE VOL 1 AND 2 | Type: | Conference Paper | Collation: | str. 369-372 | WoS-ID: | 000237180300081 | URI: | https://enauka.gov.rs/handle/123456789/813590 | Metadata source: | (Preuzeto iz Nasi u WoS) | M-category: | Mp. category will be shown later |
Google ScholarTM
Резултати на еНаука су заштићени ауторским правима и сва права су задржана, осим ако није другачије назначено.