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A defects classification algorithm for the hybrid OBT-IDDQ fault diagnosis technique in analog CMOS integrated circuits
| Title: | A defects classification algorithm for the hybrid OBT-IDDQ fault diagnosis technique in analog CMOS integrated circuits | Authors: | Mirković, Dejan |
Issue Date: | 2024 | Publication: | Journal of Circuits, Systems and Computers | ISSN: | 0218-1266 Journal of Circuits Systems and Computers Search Idenfier |
Type: | Article | Collation: | vol. 33 br. 09 str. 2450146-2450146 | DOI: | 10.1142/S0218126624501469 | WoS-ID: | 001197485500004 | Scopus-ID: | 2-s2.0-85189948682 | URI: | https://enauka.gov.rs/handle/123456789/874785 | Metadata source: | (Preuzeto iz CrossRef-a) Stanojlović Mirković, Milena | M-category: | 22M22 |
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