Type

Date issued

94 2000 - 2099
1 1950 - 1999

Mp-cat.

48 М30/М60
28 M22
5 M21
3 M20/M50
3 M24
2 M23
1 M10/M40
1 M21a
1 M51
1 M53
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Results 1-20 of 95 Results/Page

Issue Date	Title	Author(s)	Type	Мp-cat.
2024	Assessment of NBT Stressing Impact on the Continuous Operation of Power VDMOS Transistor	Veljković, Sandra ; Mitrović, Nikola ; Živanović, Emilija ; Marjanović, Miloš ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel	Conference Paper	Mp. category will be shown later
2024	Impact of Trapped Charge on the Breakdown Phenomena in HfO2/Al2O3 — Based Memory Capacitors	Spassov, D.; Paskaleva, A.; Guziewicz, E.; Ivanov, Tz.; Stanchev, T.; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Danković, Danijel	Article	22M22
2024	The effects of NBT stressing on later operation of power VDMOS transistors under normal conditions	Veljkovic, Sandra ; Mitrović, Nikola ; Davidović, Vojkan ; Albena Paskaleva; Dencho Spassov; Jovanović, Igor ; Živanović, Emilija ; Ristić, Goran ; Danković, Danijel	Conference Paper	Mp. category will be shown later
2024	Successive irradiation and bias temperature stress induced effects on commercial p-channel power VDMOS transistors	Veljković, Sandra ; Mitrović, Nikola ; Davidović, Vojkan ; Živanović, Emilija ; Ristić, Goran ; Danković, Danijel	Article	23M23
2024	International Conference on Microelectronics	Veljković, Sandra ; Živanović, Emilija ; Davidović, Vojkan ; Danković, Danijel	Article	Mp. category will be shown later
2024	Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors	Đorić Veljković, Snežana ; Živanović, Emilija ; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Ristić, Goran ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel	Article	21M21
2024	Stress-induced Degradations and Self-heating Effects in P-channel Power VDMOS Transistors	Veljković, Sandra ; Mitrović, Nikola ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel	Conference Paper	Mp. category will be shown later
2024	The role of OLED devices in the development of smart cities	Đorić Veljković, Snežana ; Mitrović, Nikola ; Veljković, Sandra ; Davidović, Vojkan ; Živanović, Emilija ; Manić, Ivica ; Danković, Danijel	Article	24M24
2023	Threshold voltage shift in irradiated and pulsed NBT stressed p-channel VDMOS transistors	Mitrović, Nikola ; Veljković, Sandra ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Živanović, Emilija ; Prijić, Zoran ; Danković, Danijel	Conference Paper	Mp. category will be shown later
2023	Effects in Commercial p-Channel Power VDMOS Transistors Initiated by Negative Bias Temperature Stress and Irradiation	Veljković, Sandra ; Mitrović, Nikola ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Živanović, Emilija ; Stanković, Srboljub ; Anđelković, Marko ; Ristić, Goran ; Paskleva, Albena; Spassov, Dentcho; Danković, Danijel ;	Conference Paper	Mp. category will be shown later
2023	Characterization of the Electric Breakdowns in Metal-Insulator-Silicon Capacitor Structures with HfO2/Al2O3 Layers for Non-Volatile Memory Applications	Spassov, Dentcho; Paskaleva, Albena; Guziewicz, Elzbieta; Ivanov, Tz.; Stanchev, T.; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Danković, Danijel	Conference Paper	Mp. category will be shown later
2023	Experimental setup and procedure for NBT stress and irradiation of VDMOS transistors	Veljković, Sandra ; Mitrović, Nikola ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Živanović, Emilija ; Prijić, Zoran ; Danković, Danijel	Conference Paper	Mp. category will be shown later
2022	Characterization of irradiated and NBT stressed p-channel power VDMOSFETs	Mitrović, Nikola ; Veljković, Sandra ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Živanović, Emilija ; Prijić, Zoran ; Danković, Danijel	Conference Paper	Mp. category will be shown later
2022	Radiation and pulsed NBTS induced threshold voltage shift in p-channel power VDMOSFETs	Mitroviћ, Nikola ; Veljković, Sandra ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Danković, Danijel ; Prijić, Zoran	Conference Paper	Mp. category will be shown later
2022	Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications	Mitrović, Nikola ; Veljković, Sandra ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Živanović, Emilija ; Prijić, Zoran ; Danković, Danijel	Article	22M22
2022	Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress	Veljković, Sandra ; Mitrović, Nikola ; Davidović, Vojkan ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Paskaleva, Albena; Spassov, Dencho; Stanković, Srboljub ; Andjelković, Marko ; Prijić, Zoran ; Manić, Ivica ; Prijić, Aneta ; Ristić, Goran ; Danković, Danijel ;	Article	22M22
2022	P-channel power VDMOSFETs under the influence of radiation and static/pulsed NBT stress	Veljković, Sandra ; Mitrović, Nikola ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Golubović, Snežana ; Prijić, Aneta ; Prijić, Zoran ; Ristić, Goran ; Danković, Danijel	Conference Paper	Mp. category will be shown later
2021	Gate oxide degradation of electronic components due to irradiation and bias temperature stress	Veljković, Sandra ; Mitrović, Nikola ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Golubović, Snežana ; Danković, Danijel	Conference Paper	Mp. category will be shown later
2021	Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs	Danković, Danijel ; Davidović, Vojkan ; Golubović, Snežana ; Veljković, Sandra ; Mitrović, Nikola ; Đorić-Veljković, Snežana	Article	22M22
2021	A Review of the Electric Circuits for NBTI Modeling in p-Channel Power VDMOSFETs	Danković, Danijel ; Mitrović, Nikola ; Veljkovic, Sandra ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Prijić, Zoran ; Paskaleva, Albena; Spassov, Dentcho; Golubović, Snežana	Conference Paper	Mp. category will be shown later