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Results 1-20 of 107
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2026 | IEEE Activities in Niš: MIEL 2025 and INSPIRE Program [Chapters] | Veljković, Sandra ; Živanović, Emilija ; Marjanović, Milos ; Mitrović, Nikola ; Davidović, Vojkan ; Danković, Danijel | Article | Mp. category will be shown later |
| 2025 | Investigating the Effects of Irradiation on the Performance of Carbyne-Based Surface Acoustic Wave Sensors | Aleksandrova, Mariya; Tomov, Rade; Danković, Danijel; Davidović, Vojkan S. ; Stanković, Srboljub | Conference Paper | Mp. category will be shown later |
| 2025 | Equivalent electrical circuit modeling of the irradiation and NBTS induced threshold voltage shift in p-channel power VDMOSFETs | Mitrović, Nikola ; Veljković, Sandra ; Davidović, Vojkan ; Stanković, Srboljub ; Đorić Veljković, Snežana ; Živanović, Emilija ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2025 | Stress-induced degradation and lifetime estimation in commercial power VDMOS transistors | Danković, Danijel; Mitrović, Nikola ; Veljković, Sandra ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan | Conference Paper | Mp. category will be shown later |
| 2025 | Is Reliability of Electronic Components Understandable to High School Students? A Workshop-Based Insight from the RESIST Project | Veljkovic, Sandra ; Mitrović, Nikola ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel | Contribution to periodical | Mp. category will be shown later |
| 2025 | Impact of Bias Temperature Stress, Irradiation and Self-Heating Effects on p-Channel Power VDMOS Transistors | Veljković, Sandra ; Mitrović, Nikola ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel | Contribution to periodical | Mp. category will be shown later |
| 2025 | Examination of Impact of NBTIs on Commercial Power P-Channel VDMOS Transistors in Practical Applications | Danković, Danijel ; Živanović, Emilija ; Veselinović, Nevena; Đorđević, Dunja; Petrović, Marija; Tasić, Lana; Marjanović, Miloš ; Veljković, Sandra ; Mitrović, Nikola ; Davidović, Vojkan ;
Ristić, Goran
; | Article | 21M21 |
| 2025 | Experimental and SPICE-Based Modeling of NBTI and SHE in Power P-Channel VDMOS Transistors | Tasić, Lana; Veselinović, Nevena; Petrović, Marija; Đorđević, Dunja; Marjanović, Miloš ; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Živanović, Emilija ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2025 | Influence of Magnetic Field on Commercial P-Channel VDMOSFETs | Mitrović, Nikola ; Veljkovic, Sandra ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel | Contribution to periodical | Mp. category will be shown later |
| 2025 | Thermal Cycling and Irradiation Stressing of Low Impedance Aluminum Electrolytic Capacitors | Tasic, Lana; Davidovic, Vojkan S ; Ristic, Goran S ; Prijic, Zoran D | Conference Paper | Mp. category will be shown later |
| 2025 | Recovery Behavior of VDMOS Transistors under Sequential Irradiation and NBT Stress | Đorić-Veljković, Snežana ; Živanović, Emilija ; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Ristić, Goran ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2025 | Impact of NBTS and Thermal Relaxation on Characteristic of CMOS Inverter | Veselinović, Nevena; Petrović, Marija; Đorđević, Dunja; Tasić, Lana; Mitrović, Nikola ; Veljković, Sandra ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2025 | Influence of Pre-Stress Conditions on the Self-Heating Behavior of Power MOSFETs | Veljković, Sandra ; Mitrović, Nikola ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Stanković, Srboljub ; Ristić, Goran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2024 | Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors | Đorić Veljković, Snežana ; Živanović, Emilija ; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Ristić, Goran ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel | Article | 21M21 |
| 2024 | Stress-induced Degradations and Self-heating Effects in P-channel Power VDMOS Transistors | Veljković, Sandra ; Mitrović, Nikola ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2024 | The role of OLED devices in the development of smart cities | Đorić Veljković, Snežana ; Mitrović, Nikola ; Veljković, Sandra ; Davidović, Vojkan ; Živanović, Emilija ; Manić, Ivica ; Danković, Danijel | Article | 24M24 |
| 2024 | The effects of NBT stressing on later operation of power VDMOS transistors under normal conditions | Veljkovic, Sandra ; Mitrović, Nikola ; Davidović, Vojkan ; Albena Paskaleva; Dencho Spassov; Jovanović, Igor ; Živanović, Emilija ; Ristić, Goran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2024 | International Conference on Microelectronics | Veljković, Sandra ; Živanović, Emilija ; Davidović, Vojkan ; Danković, Danijel | Article | Mp. category will be shown later |
| 2024 | Assessment of NBT Stressing Impact on the Continuous Operation of Power VDMOS Transistor | Veljković, Sandra ; Mitrović, Nikola ; Živanović, Emilija ; Marjanović, Miloš ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2024 | Impact of Trapped Charge on the Breakdown Phenomena in HfO2/Al2O3 — Based Memory Capacitors | Spassov, D.; Paskaleva, A.; Guziewicz, E.; Ivanov, Tz.; Stanchev, T.; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Danković, Danijel | Article | 22M22 |