Davidović, Vojkan

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Date issued

Mp-cat.

54 М30/М60
29 M22
7 M20/M50
6 M21
3 M24
2 M23
1 M10/M40
1 M21a
1 M51
1 M53
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Results 41-60 of 107 Results/Page

Issue Date	Title	Author(s)	Type	Мp-cat.
2019	Procedure merenja električnih karakteristika naprezanih p-kanalnih VDMOS tranzistora snage	Đorić-Veljković, Snežana M. ; Davidović, Vojkan S. ; Danković, Danijel M. ; Golubović, Snežana M. ; Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2018	A review of pulsed NBTI in P-channel power VDMOSFETs	Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Davidović, Vojkan ; Prijić, Zoran ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Paskaleva, A.; Spassov, D.; Stojadinović, Ninoslav	Article	22M22
2018	Effects of consecutive irradiation and bias temperature stress in p-channel power vertical double-diffused metal oxide semiconductor transistors	Davidović, Vojkan ; Danković, Danijel ; Ilić, Aleksandar; Manić, Ivica ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Prijić, Zoran ; Prijić, Aneta ; Stojadinović, Ninoslav	Article	22M22
2018	Karakterizacija električno programabilnog MOS tranzistora sa plivajućim gejtom	Jevtić, Aleksandar S. ; Ilić, Stefan ; Davidović, Vojkan ; Prijić, Aneta P. ; Prijić, Zoran	Conference Paper	Mp. category will be shown later
2018	Elektrohemijski procesi kod p-kanalnih VDMOS tranzistora snage pri sukcesivnom NBT naprezanju i ozračivanju	Davidović, Vojkan S. ; Danković, Danijel M. ; Golubović, Snežana M. ; Đorić-Veljković, Snežana M. ; Ivica Manić ; Prijić, Zoran D. ; Prijić, Aneta P. ; Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2018	NBT stress and radiation related degradation and underlying mechanisms in power VDMOSFETs	Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Đorić Veljković, Snežana ; Manić, Ivica ; Prijić, Zoran ; Prijić, Aneta ; Stojadinović, Ninoslav ; Stankovic, Srboljub	Article	24M24
2018	Dekapsulacija i analiza EPAD-a	Aleksandar Jevtić; Stefan Ilić ; Davidović, Vojkan S.	Conference Paper	Mp. category will be shown later
2018	NBTI and irradiation related degradation mechanisms in power VDMOS transistors	Stojadinović, Ninoslav ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Stanković, Srboljub ; Prijić, Aneta ; Prijić, Zoran ; Manić, Ivica ; Danković, Danijel	Article	22M22
2017	Modelling of Threshold Voltage Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs	Danković, Danijel M. ; Manić, Ivica Đ. ; Stojadinović, Ninoslav D. ; Prijić, Zoran D. ; Đorić-Veljković, Snežana M. ; Davidović, Vojkan S. ; Prijić, Aneta P. ; A. Paskaleva; D. Spassov; Golubović, Snežana B.	Conference Paper	Mp. category will be shown later
2017	Electrical and Charge Trapping Properties of HfO2/Al2O3 Multilayer Dielectric Stacks	Davidović, Vojkan S. ; A. Paskaleva; D. Spassov; E. Guziewicz; T. Krajewski; Golubović, Snežana M. ; Đorić-Veljković, Snežana M. ; Manić, Ivica Đ. ; Danković, Danijel M. ; Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2017	Ispitivanje višeslojnih HfO2/Al2O3 struktura za memorijske komponente	Davidović, Vojkan S. ; A. Paskaleva; D. Spassov; E. Guziewicz; T. Krajewski; Golubović, Snežana M. ; Đorić-Veljković, Snežana M. ; Manić, Ivica Đ. ; Danković, Danijel M. ; Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2016	PSPICE Modeling of Ionizing Radiation Effects in P-channel Power VDMOS Transistors	Marjanović, Miloš ; Prijić, Aneta ; Danković, Danijel ; Prijić, Zoran ; Davidović, Vojkan	Conference Paper	Mp. category will be shown later
2016	On the Recoverable and Permanent Components of NBTI in p-Channel Power VDMOSFETs	Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Marjanović, Miloš ; Ilic, Aleksandar; Prijić, Zoran ; Stojadinović, Ninoslav	Article	21M21
2016	Effects of pulsed negative bias temperature stressing in p-channel power VDMOSFETs	Manić, Ivica ; Danković, Danijel ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	24M24
2016	MODELING AND PSPICE SIMULATION OF RADIATION STRESS INFLUENCE ON THRESHOLD VOLTAGE SHIFTS IN P-CHANNEL POWER VDMOS TRANSISTORS	Marjanović, Miloš ; Danković, Danijel ; Davidović, Vojkan ; Prijić, Aneta ; Stojadinović, Ninoslav ; Prijić, Zoran ; Janković, Nebojša	Article	Mp. category will be shown later
2016	NBTI and Irradiation Effects in P-Channel Power VDMOS Transistors	Davidović, Vojkan ; Danković, Danijel ; Ilic, Aleksandar; Manić, Ivica ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	21M21
2015	Modeling and PSPICE simulation of NBTI effects in VDMOS transistors	Marjanović, Miloš ; Danković, Danijel ; Prijić, Aneta ; Prijić, Zoran ; Janković, Nebojša ; Davidović, Vojkan	Article	51M51
2015	Annealing influence on recovery of electrically stressed power vertical double-diffused metal oxide semiconductor transistors	Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav	Article	22M22
2015	Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation	Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Stojadinović, Ninoslav ; Prijić, Zoran ; Golubović, Snežana	Article	21M21
2015	Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET	Danković, Danijel ; Stojadinović, Ninoslav ; Prijić, Zoran ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana	Article	22M22