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Browsing by Author Jakšić, Aleksandar
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| Issue Date | Title | Author(s) | Type | М-cat. |
|---|---|---|---|---|
| 2020 | Institucije naslednog prava | Đurđević, Dejan B. | Monograph | Mp. category will be shown later |
| 1995 | Latent interface-trap generation during thermal annealing of γ-ray irradiated power VDMOSFETs (✓) | Jakšić, Aleksandar; Ristić, Goran   ; Pejovic, Momčilo | Conference Paper | Mp. category will be shown later |
| 1998 | Latent interface-trap generation in commercial power VDMOSFETs (✓) | Jakšić, Aleksandar; Pejović, Momčilo ; Ristić, Goran ; Raković, S. | Conference Paper | Mp. category will be shown later |
| 2016 | Međunarodno građansko procesno pravo | Jakšić, Aleksandar | Monograph | Mp. category will be shown later |
| 2017 | Međunarodno privatno pravo : opšta teorija | Jakšić, Aleksandar | Text book | Mp. category will be shown later |
| 2019 | Множина субјеката у парничном поступку са елементом иностраности | Babović, Branka | Doctoral theses | 70M70 |
| 1998 | Modelling of kinetics of creation and passivation of interface traps in metal-oxide-semiconductor transistors during postirradiation annealing (✓) | Ristić, Goran ; Pejović, Momčilo ; Jakšić, Aleksandar | Article | 21M21 |
| 2008 | NATO intervention in the Former Yugoslavia : individual damage compensation claims : jurisdiction and applicable law | Jakšić, Aleksandar | Monograph | Mp. category will be shown later |
| 1998 | Numerical simulation of creation-passivation kinetics of interface traps in irradiated n-channel power VDMOSFETs during thermal annealing with various gate biases (✓) | Ristić, Goran ; Pejović, Momčilo ; Jakšić, Aleksandar | Article | 21M21 |
| 2019 | One numerical method for determining the absorbed dose of gamma and X radiation in the ZrO2 dielectric within the MOS capacitor (✓) | Stanković, Srboljub J. ; Jakšić, Aleksandar; Lončar, Boris; Nikolić, Dragana J. ; Radenković, Mirjana | Conference Paper | Mp. category will be shown later |
| 1997 | pMOS dosimetric transistors with two-layer gate oxide (✓) | Ristić, Goran ; Jakšić, Aleksandar; Pejović, Momčilo | Article | 22M22 |
| 2000 | Post-irradiation behavior of commercial power VDMOSFETs (✓) | Jakšić, Aleksandar; Pejović, Momčilo ; Ristić, Goran | Conference Paper | Mp. category will be shown later |
| 1997 | Processes in n-channel MOSFETS during postirradiation thermal annealing (✓) | Pejović, Momčilo ; Jakšić, Aleksandar; Ristić, Goran ; Baljošević, B. | Article | 22M22 |
| 2017 | Razlika između odziva RADFET u statičkom i dinamičkom on-line mernom sistemu prilikom izlaganja gama zračenju Co60 (✓) | Stanković, Srboljub J. ; Jakšić, Aleksandar; Vasović, Nikola; Lončar, Boris B.; Kržanović, Nikola ; Živanović, Miloš Z. | Conference Paper | Mp. category will be shown later |
| 1995 | Rebound effect in power VDMOSFETs due to latent interface-trap generation (✓) | Jakšić, Aleksandar; Ristić, Goran ; Pejović, Momčilo | Article | Mp. category will be shown later |
| 2016 | Sensitivity of standard and stacked RADFET dosimeters (✓) | Jakšić, Aleksandar; Vasović, Nikola; Stanković, Srboljub | Conference Paper | Mp. category will be shown later |
| 1998 | The behaviour of radiation-induced gate-oxide defects in MOSFETs during annealing at 140°C (✓) | Pejović, Momčilo ; Jakšić, Aleksandar; Ristić, Goran | Article | 21M21 |
| 2023 | Towards a Smart Multi-Sensor Ionizing Radiation Monitoring System (✓) | Andjelković, Marko ; Chen, Junchao; Syed, Rizwan Tariq; Vargas, Fabian; Ulbricht, Markus; Krstić, Miloš ; Ilić, Stefan; Marjanović, Miloš ; Veljković, Sandra ; Mitrović, Nikola ;
Danković, Danijel
; Ristić, Goran ; Duane, Russell; Vasović, Nikola; Jakšić, Aleksandar; Palma, Alberto J.; Lallena, Antonio M.; Carvajal, Miguel A.; | Conference Paper | Mp. category will be shown later |