Researchers
Davidović, Vojkan
Results 101-108 of 108
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2002 | Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs![]() | Stojadinović, Ninoslav | Article | 22M22 |
| 2001 | Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs![]() | Stojadinovic, Ninoslav D; Manic, Ivica Dj | Article | 22M22 |
| 2001 | Effects of elevated-temperature bias stressing on radiation response in power VDMOSFETs | Stojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S | Conference Paper | Mp. category will be shown later |
| 2001 | Modeling of gamma-irradiation and lowered temperature effects in power vertical double-diffused metal-oxide-semiconductor transistors (Erratum - errors in Authors - vol 38, pg 4699, 1999)</strong></font> | Stojadinovic, Ninoslav D; Golubovic, Snezana M; Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S | Other | Mp. category will be shown later |
| 2001 | Analytical modelling of electrical characteristics in gamma-irradiated power VDMOS transistors![]() | Manić, Ivica | Article | 22M22 |
| 2001 | Gamma-irradiation effects in power MOSFETs for application in communication satellites | Stojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S | Conference Paper | Mp. category will be shown later |
| 2000 | Radiation effects in low-temperature stressed power VDMOS transistors | Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S | Conference Paper | Mp. category will be shown later |
| 1995 | Effect of radiation-induced oxide-trapped charge on mobility in p-channel MOSFETs![]() | Stojadinović, Ninoslav | Article | Mp. category will be shown later |
