Researchers

Results 101-108 of 108
Issue DateTitleAuthor(s)TypeМp-cat.
2002Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETsStojadinović, Ninoslav ; Manić, Ivica  ; Đorić Veljković, Snežana  ; Davidović, Vojkan  ; Danković, Danijel  ; Golubović, Snežana ; Dimitrijev, SimaArticle
22M22
2001Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETsStojadinovic, Ninoslav D; Manic, Ivica Dj  ; Đoric-Veljkovic, Snezana M  ; Davidovic, Vojkan S  ; Golubovic, Snezana M; Dimitrijev, SimaArticle
22M22
2001Effects of elevated-temperature bias stressing on radiation response in power VDMOSFETsStojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S  ; Golubovic, Snezana MConference Paper
Mp. category will be shown later
2001Modeling of gamma-irradiation and lowered temperature effects in power vertical double-diffused metal-oxide-semiconductor transistors (Erratum - errors in Authors - vol 38, pg 4699, 1999)</strong></font>Stojadinovic, Ninoslav D; Golubovic, Snezana M; Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S  Other
Mp. category will be shown later
2001Analytical modelling of electrical characteristics in gamma-irradiated power VDMOS transistorsManić, Ivica  ; Pavlović, Zoran; Prijić, Zoran  ; Davidović, Vojkan  ; Stojadinović, Ninoslav Article
22M22
2001Gamma-irradiation effects in power MOSFETs for application in communication satellitesStojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S  ; Manic, Ivica Dj; Golubovic, Snezana MConference Paper
Mp. category will be shown later
2000Radiation effects in low-temperature stressed power VDMOS transistorsDjoric-Veljkovic, Snezana M; Davidovic, Vojkan S  ; Golubovic, Snezana M; Stojadinovic, Ninoslav DConference Paper
Mp. category will be shown later
1995Effect of radiation-induced oxide-trapped charge on mobility in p-channel MOSFETsStojadinović, Ninoslav ; Pejović, Momčilo ; Golubović, Snežana ; Ristić, Goran  ; Davidović, Vojkan  ; Dimitrijev, SimaArticle
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