Researchers
Danković, Danijel
Results 121-140 of 183
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2017 | A Steady-State SPICE Modeling of the Thermoelectric Wireless Sensor Network Node | Prijić, Aneta P.   ; Marjanović, Miloš B. ; Vračar, Ljubomir M. ; Danković, Danijel M. ; D. Milić; Prijić, Zoran D. | Conference Paper | Mp. category will be shown later |
| 2017 | Deset godina Konferencije studentskih projekata IEEESTEC | Marjanović, Miloš B. ; Danković, Danijel M. | Conference Paper | Mp. category will be shown later |
| 2017 | Ispitivanje višeslojnih HfO2/Al2O3 struktura za memorijske komponente | Davidović, Vojkan S. ; A. Paskaleva; D. Spassov; E. Guziewicz; T. Krajewski; Golubović, Snežana M. ; Đorić-Veljković, Snežana M. ; Manić, Ivica Đ. ; Danković, Danijel M. ; Stojadinović, Ninoslav D. | Conference Paper | Mp. category will be shown later |
| 2017 | Consideration of conduction mechanisms in high-k dielectric stacks as a tool to study electrically active defects | Paskaleva, Albena; Spassov, Dencho; Danković, Danijel | Article | 24M24 |
| 2016 | Effects of pulsed negative bias temperature stressing in p-channel power VDMOSFETs | Manić, Ivica ; Danković, Danijel ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav | Article | 24M24 |
| 2016 | PSPICE Modeling of Ionizing Radiation Effects in P-channel Power VDMOS Transistors | Marjanović, Miloš ; Prijić, Aneta ; Danković, Danijel ; Prijić, Zoran ; Davidović, Vojkan | Conference Paper | Mp. category will be shown later |
| 2016 | On the Recoverable and Permanent Components of NBTI in p-Channel Power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Marjanović, Miloš ; Ilic, Aleksandar; Prijić, Zoran ; Stojadinović, Ninoslav | Article | 21M21 |
| 2016 | NBTI and Irradiation Effects in P-Channel Power VDMOS Transistors | Davidović, Vojkan ; Danković, Danijel ; Ilic, Aleksandar; Manić, Ivica ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav | Article | 21M21 |
| 2016 | MODELING AND PSPICE SIMULATION OF RADIATION STRESS INFLUENCE ON THRESHOLD VOLTAGE SHIFTS IN P-CHANNEL POWER VDMOS TRANSISTORS | Marjanović, Miloš ; Danković, Danijel ; Davidović, Vojkan ; Prijić, Aneta ; Stojadinović, Ninoslav ; Prijić, Zoran ; Janković, Nebojša | Article | Mp. category will be shown later |
| 2015 | Annealing influence on recovery of electrically stressed power vertical double-diffused metal oxide semiconductor transistors | Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2015 | High frequency characterization and modelling of ceramic capacitors | Marjanović, Miloš ; Danković, Danijel ; Prijić, Aneta ; Paunović, Vesna ; Prijić, Zoran | Conference Paper | Mp. category will be shown later |
| 2015 | Modeling and PSPICE simulation of NBTI effects in VDMOS transistors | Marjanović, Miloš ; Danković, Danijel ; Prijić, Aneta ; Prijić, Zoran ; Janković, Nebojša ; Davidović, Vojkan | Article | 51M51 |
| 2015 | Practical aspects of cellular M2M systems design | Prijić, Aneta ; Vračar, Ljubomir ; Vuckovic, Dusan; Danković, Danijel ; Prijić, Zoran | Article | 24M24 |
| 2015 | Characterization and PSPICE Modeling of Ceramic-Core Inductors at High Frequencies | Marjanović, Miloš ; Paunović, Vesna ; Danković, Danijel ; Prijić, Aneta ; Prijić, Zoran | Conference Paper | Mp. category will be shown later |
| 2015 | Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation | Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Stojadinović, Ninoslav ; Prijić, Zoran ; Golubović, Snežana | Article | 21M21 |
| 2015 | Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET | Danković, Danijel ; Stojadinović, Ninoslav ; Prijić, Zoran ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana | Article | 22M22 |
| 2015 | Modeling and PSPICE Simulation of Radiation Stress Influence on Threshold Voltage Shifts in P-Channel Power VDMOS Transistors | Marjanović, Miloš ; Danković, Danijel ; Davidović, Vojkan ; Prijić, Aneta ; Stojadinović, Ninoslav D. ; Prijić, Zoran ; Janković, Nebojša D. | Conference Paper | Mp. category will be shown later |
| 2014 | A Method for Measuring NBTI Degradation in p-channel Power VDMOSFETs | Prijić, Zoran ; Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2014 | Recoverable and permanent components of V<inf>T</inf> shift in pulsed NBT stressed p-channel power VDMOSFETs | Danković, Danijel ; Stojadinović, Ninoslav ; Prijić, Zoran ; Manić, Ivica ; Prijić, Aneta | Conference Paper | Mp. category will be shown later |
| 2014 | Measurement of NBTI Degradation in p-channel Power VDMOSFETs | Manić, Ivica Đ. ; Danković, Danijel ; Prijić, Aneta ; Prijić, Zoran ; Stojadinović, Ninoslav D. | Article | 23M23 |