Researchers
Živanović, Emilija
Results 21-40 of 76
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2024 | Laboratorijske vežbe iz oblasti mikroelektronike uvirtuelnoj realnosti![]() | Gavrić, Aleksandar | Conference Paper | Mp. category will be shown later |
| 2024 | Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors![]() | Đorić Veljković, Snežana | Article | 21M21 |
| 2024 | A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress![]() | Živanović, Emilija | Article | 21M21 |
| 2024 | International Conference on Microelectronics![]() | Veljković, Sandra | Article | Mp. category will be shown later |
| 2024 | Istorijat i razvoj elektronike u Nišu![]() | Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2024 | IEEESTEC 17th Student Projects Conference [November 28, 2024, Niš, Serbia]. Proceedings of Papers.![]() | Marković, Vera | Editorial works | Mp. category will be shown later |
| 2024 | The effects of NBT stressing on later operation of power VDMOS transistors under normal conditions![]() | Veljkovic, Sandra | Conference Paper | Mp. category will be shown later |
| 2024 | Assessment of NBT Stressing Impact on the Continuous Operation of Power VDMOS Transistor![]() | Veljković, Sandra | Conference Paper | Mp. category will be shown later |
| 2024 | Successive irradiation and bias temperature stress induced effects on commercial p-channel power VDMOS transistors![]() | Veljković, Sandra | Article | 23M23 |
| 2024 | Stress-induced Degradations and Self-heating Effects in P-channel Power VDMOS Transistors![]() | Veljković, Sandra | Conference Paper | Mp. category will be shown later |
| 2024 | Modified SPICE-Compatible Model Integrating NBTI and Self-Heating Effects for VDMOS Transistors![]() | Marjanović, Miloš | Conference Paper | Mp. category will be shown later |
| 2024 | The role of OLED devices in the development of smart cities![]() | Đorić Veljković, Snežana | Article | 24M24 |
| 2023 | Let’s All Go to the 16th IEEESTEC!![]() | Veljković, Sandra | Article | Mp. category will be shown later |
| 2023 | Effects in Commercial p-Channel Power VDMOS Transistors Initiated by Negative Bias Temperature Stress and Irradiation![]() | Veljković, Sandra | Conference Paper | Mp. category will be shown later |
| 2023 | Breakdown Voltage Stability Testing of Gas Surge Arrester Littelfuse CG2300 Under Different Environmental Conditions![]() | Živanović, Emilija | Conference Paper | Mp. category will be shown later |
| 2023 | The Importance of Students’ Practical Work in High Schools for Higher Education in Electronic Engineering![]() | Danković, Danijel | Article | 21M21 |
| 2023 | EXTRACURRICULAR ACTIVITIES IN THE FUNCTION OF IMPROVING PRACTICAL SKILLS OF FUTURE STUDENTS IN THE FIELD OF ЕLECTRICAL ENGINEERING AND COMPUTING![]() | Živanović, Emilija | Article | Mp. category will be shown later |
| 2023 | Effects of self-heating and NBTI-induced stress on p-channel power VDMOSFETs![]() | Veljković, Sandra | Conference Paper | Mp. category will be shown later |
| 2023 | The gamma radiation influence on the breakdown voltage stability of gas-filled surge arresters![]() | Veljković, Sandra | Conference Paper | Mp. category will be shown later |
| 2023 | Threshold voltage shift in irradiated and pulsed NBT stressed p-channel VDMOS transistors![]() | Mitrović, Nikola | Conference Paper | Mp. category will be shown later |
