Researchers

Results 21-40 of 76
Issue DateTitleAuthor(s)TypeМp-cat.
2024Laboratorijske vežbe iz oblasti mikroelektronike uvirtuelnoj realnostiGavrić, Aleksandar  ; Mitrović, Nikola  ; Živanović, Emilija  ; Marjanović, Miloš  ; Danković, Danijel  ; Veljković, Sandra  ; Danković, Milan; Stanimirović, Aleksandar  ; Stoimenov, Leonid  Conference Paper
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2024Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS TransistorsĐorić Veljković, Snežana  ; Živanović, Emilija  ; Davidović, Vojkan  ; Veljković, Sandra  ; Mitrović, Nikola  ; Ristić, Goran  ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel  Article
21M21
2024A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature StressŽivanović, Emilija  ; Veljković, Sandra  ; Mitrović, Nikola  ; Jovanović, Igor  ; Đorić Veljković, Snežana  ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel  Article
21M21
2024International Conference on MicroelectronicsVeljković, Sandra  ; Živanović, Emilija  ; Davidović, Vojkan  ; Danković, Danijel  Article
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2024Istorijat i razvoj elektronike u NišuDanković, Danijel  ; Živanović, Emilija  ; Marjanović, Miloš  ; Veljkovic, Sandra  ; Mitrović, Nikola  Conference Paper
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2024IEEESTEC 17th Student Projects Conference [November 28, 2024, Niš, Serbia]. Proceedings of Papers.Marković, Vera  ; Danković, Danijel  ; Marinković, Zlatica  ; Marjanović, Miloš  ; Stošić, Biljana  ; Živanović, Emilija  Editorial works
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2024The effects of NBT stressing on later operation of power VDMOS transistors under normal conditionsVeljkovic, Sandra  ; Mitrović, Nikola  ; Davidović, Vojkan  ; Albena Paskaleva; Dencho Spassov; Jovanović, Igor  ; Živanović, Emilija  ; Ristić, Goran  ; Danković, Danijel  Conference Paper
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2024Assessment of NBT Stressing Impact on the Continuous Operation of Power VDMOS TransistorVeljković, Sandra  ; Mitrović, Nikola  ; Živanović, Emilija  ; Marjanović, Miloš  ; Davidović, Vojkan  ; Ristić, Goran  ; Danković, Danijel  Conference Paper
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2024Successive irradiation and bias temperature stress induced effects on commercial p-channel power VDMOS transistorsVeljković, Sandra  ; Mitrović, Nikola  ; Davidović, Vojkan  ; Živanović, Emilija  ; Ristić, Goran  ; Danković, Danijel  Article
23M23
2024Stress-induced Degradations and Self-heating Effects in P-channel Power VDMOS TransistorsVeljković, Sandra  ; Mitrović, Nikola  ; Marjanović, Miloš  ; Živanović, Emilija  ; Davidović, Vojkan  ; Ristić, Goran  ; Danković, Danijel  Conference Paper
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2024Modified SPICE-Compatible Model Integrating NBTI and Self-Heating Effects for VDMOS TransistorsMarjanović, Miloš  ; Veljković, Sandra  ; Mitrović, Nikola  ; Źivanović, Emilija  ; Gavrić, Aleksandar  ; Danković, Danijel  Conference Paper
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2024The role of OLED devices in the development of smart citiesĐorić Veljković, Snežana  ; Mitrović, Nikola  ; Veljković, Sandra  ; Davidović, Vojkan  ; Živanović, Emilija  ; Manić, Ivica  ; Danković, Danijel  Article
24M24
2023Let’s All Go to the 16th IEEESTEC!Veljković, Sandra  ; Marjanović, Miloš  ; Živanović, Emilija  ; Danković, Danijel  Article
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2023Effects in Commercial p-Channel Power VDMOS Transistors Initiated by Negative Bias Temperature Stress and IrradiationVeljković, Sandra  ; Mitrović, Nikola  ; Đorić-Veljković, Snežana  ; Davidović, Vojkan  ; Manić, Ivica  ; Živanović, Emilija  ; Stanković, Srboljub  ; Anđelković, Marko ; Ristić, Goran  ; Paskleva, Albena;
Spassov, Dentcho; Danković, Danijel  ;
Conference Paper
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2023Breakdown Voltage Stability Testing of Gas Surge Arrester Littelfuse CG2300 Under Different Environmental ConditionsŽivanović, Emilija  ; Stojiljković, N.; Veljković, Sandra  Conference Paper
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2023The Importance of Students’ Practical Work in High Schools for Higher Education in Electronic EngineeringDanković, Danijel  ; Marjanović, Miloš  ; Mitrović, Nikola  ; Živanović, Emilija  ; Danković, Milan; Prijić, Aneta  ; Prijić, Zoran  Article
21M21
2023EXTRACURRICULAR ACTIVITIES IN THE FUNCTION OF IMPROVING PRACTICAL SKILLS OF FUTURE STUDENTS IN THE FIELD OF ЕLECTRICAL ENGINEERING AND COMPUTINGŽivanović, Emilija  ; Marjanović, Miloš  ; Danković, Danijel  Article
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2023Effects of self-heating and NBTI-induced stress on p-channel power VDMOSFETsVeljković, Sandra  ; Mitrović, Nikola  ; Jovanović, Igor  ; Živanović, Emilija  ; Paskaleva, Albena; Ristić, Goran  ; Danković, Danijel  Conference Paper
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2023The gamma radiation influence on the breakdown voltage stability of gas-filled surge arrestersVeljković, Sandra  ; Živanović, Emilija  Conference Paper
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2023Threshold voltage shift in irradiated and pulsed NBT stressed p-channel VDMOS transistorsMitrović, Nikola  ; Veljković, Sandra  ; Davidović, Vojkan  ; Đorić Veljković, Snežana  ; Golubović, Snežana ; Živanović, Emilija  ; Prijić, Zoran  ; Danković, Danijel  Conference Paper
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