Researchers
Manić, Ivica
Type
Date issued
Results 21-40 of 68
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2014 | Recoverable and Permanent Components of V-T Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs![]() | Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2014 | Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors![]() | Stojadinović, Ninoslav | Book parts | Mp. category will be shown later |
| 2014 | A Method for Measuring NBTI Degradation in p-channel Power VDMOSFETs | Prijić, Zoran | Conference Paper | Mp. category will be shown later |
| 2014 | Recoverable and permanent components of V<inf>T</inf> shift in pulsed NBT stressed p-channel power VDMOSFETs | Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2014 | Recovery Treatment Effects on Gamma Radiation Response in Electrically Stressed Power VDMOS Transistors![]() | Đorić-Veljković, Snežana | Conference Paper | Mp. category will be shown later |
| 2014 | Measurement of NBTI Degradation in p-channel Power VDMOSFETs | Manić, Ivica Đ. | Article | 23M23 |
| 2013 | Uticaj odžarivanja na oporavak električno naprezanih p-kanalnih VDMOS tranzistora snage![]() | Đorić-Veljković, Snežana | Conference Paper | Mp. category will be shown later |
| 2013 | Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs![]() | Danković, Danijel | Article | 23M23 |
| 2013 | The Comparison of Gamma-Radiation and Electrical Stress Influences on Oxide and Interface Defects in Power Vdmosfet![]() | Đorić-Veljković, Snežana | Article | 22M22 |
| 2013 | Time-dependent dielectric breakdown in pure and lightly Al-doped Ta2O5 stacks | Elena Atanassova; Stojadinović, Ninoslav | Article | 21M21 |
| 2013 | Naponsko temperaturna naprezanja p-kanalnih VDMOS tranzistora snage | Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2012 | Lifetime estimation in nbt-stressed p-channel power VDMOSFETS![]() | Danković, Danijel | Article | 53M53 |
| 2012 | Nova metoda za ispitivanje nestabilnosti usled naponsko temperaturnih naprezanja VDMOS tranzistora snage | Danković, Danijel | Technical reports | Mp. category will be shown later |
| 2012 | Measurements of Negative Bias Temperature Instability (NBTI) in p-Channel Power VDMOSFETs | Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2012 | Određivanje perioda pouzdanog rada p-kanalnih VDMOS tranzistora snage podvrgnutih kontinualnim i impulsnim NBT naprezanjima![]() | Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2012 | Modelovanje napona praga p-kanalnih VDMOS tranzistora snage tokom naponsko temperaturnih naprezanja i odžarivanja | Manić, Ivica | Conference Paper | Mp. category will be shown later |
| 2012 | A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors | Prijić, Aneta | Article | 21M21 |
| 2011 | NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions![]() | Manić, Ivica | Article | 22M22 |
| 2011 | Hf-doped Ta2O5 stacks under constant voltage stress | Manić, Ivica | Article | 21M21 |
| 2011 | Annealing of radiation-induced defects in burn-in stressed power VDMOSFETs![]() | Đorić-Veljković, Snežana | Article | 22M22 |
