Manić, Ivica

Type

Date issued

Mp-cat.

30 М30/М60
22 M22
6 M21
3 M24
2 M10/M40
2 M23
1 M20/M50
1 M53
1 M80

Date issued - custom

Year from:

Year to:

Results 21-40 of 68 Results/Page

Issue Date	Title	Author(s)	Type	Мp-cat.
2014	Recoverable and Permanent Components of V-T Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs	Danković, Danijel ; Stojadinović, Ninoslav ; Prijić, Zoran ; Manić, Ivica ; Prijić, Aneta	Conference Paper	Mp. category will be shown later
2014	Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors	Stojadinović, Ninoslav ; Manić, Ivica ; Danković, Danijel ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Prijić, Aneta ; Golubović, Snežana ; Prijić, Zoran	Book parts	Mp. category will be shown later
2014	A Method for Measuring NBTI Degradation in p-channel Power VDMOSFETs	Prijić, Zoran ; Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2014	Recoverable and permanent components of V<inf>T</inf> shift in pulsed NBT stressed p-channel power VDMOSFETs	Danković, Danijel ; Stojadinović, Ninoslav ; Prijić, Zoran ; Manić, Ivica ; Prijić, Aneta	Conference Paper	Mp. category will be shown later
2014	Recovery Treatment Effects on Gamma Radiation Response in Electrically Stressed Power VDMOS Transistors	Đorić-Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Manić, Ivica ; Golubović, Snežana ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2014	Measurement of NBTI Degradation in p-channel Power VDMOSFETs	Manić, Ivica Đ. ; Danković, Danijel ; Prijić, Aneta ; Prijić, Zoran ; Stojadinović, Ninoslav D.	Article	23M23
2013	Uticaj odžarivanja na oporavak električno naprezanih p-kanalnih VDMOS tranzistora snage	Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2013	Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs	Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	23M23
2013	The Comparison of Gamma-Radiation and Electrical Stress Influences on Oxide and Interface Defects in Power Vdmosfet	Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav	Article	22M22
2013	Time-dependent dielectric breakdown in pure and lightly Al-doped Ta2O5 stacks	Elena Atanassova; Stojadinović, Ninoslav ; Dencho Spassov; Manić, Ivica ; Albena Paskaleva	Article	21M21
2013	Naponsko temperaturna naprezanja p-kanalnih VDMOS tranzistora snage	Danković, Danijel ; Prijić, Aneta ; Manić, Ivica Đ. ; Prijić, Zoran ; Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2012	Lifetime estimation in nbt-stressed p-channel power VDMOSFETS	Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	53M53
2012	Nova metoda za ispitivanje nestabilnosti usled naponsko temperaturnih naprezanja VDMOS tranzistora snage	Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Vračar, Ljubomir M. ; Prijić, Zoran ; Stojadinović, Ninoslav	Technical reports	Mp. category will be shown later
2012	Measurements of Negative Bias Temperature Instability (NBTI) in p-Channel Power VDMOSFETs	Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Prijić, Zoran ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2012	Određivanje perioda pouzdanog rada p-kanalnih VDMOS tranzistora snage podvrgnutih kontinualnim i impulsnim NBT naprezanjima	Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Davidović, Vojkan ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav ; Đorić-Veljković, Snežana	Conference Paper	Mp. category will be shown later
2012	Modelovanje napona praga p-kanalnih VDMOS tranzistora snage tokom naponsko temperaturnih naprezanja i odžarivanja	Manić, Ivica ; Danković, Danijel ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2012	A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors	Prijić, Aneta ; Danković, Danijel ; Vračar, Ljubomir ; Manić, Ivica ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	21M21
2011	NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions	Manić, Ivica ; Danković, Danijel ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	22M22
2011	Hf-doped Ta2O5 stacks under constant voltage stress	Manić, Ivica ; Atanassova, E.; Stojadinović, Ninoslav ; Spassov, D.; Paskaleva, A.	Article	21M21
2011	Annealing of radiation-induced defects in burn-in stressed power VDMOSFETs	Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav	Article	22M22