Type

Date issued

67 2000 - 2099
1 1950 - 1999

Mp-cat.

31 М30/М60
21 M22
6 M21
3 M24
2 M10/M40
2 M23
1 M20/M50
1 M53
1 M80

Date issued - custom

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Results 1-20 of 68 Results/Page

Issue Date	Title	Author(s)	Type	Мp-cat.
2024	The role of OLED devices in the development of smart cities	Đorić Veljković, Snežana ; Mitrović, Nikola ; Veljković, Sandra ; Davidović, Vojkan ; Živanović, Emilija ; Manić, Ivica ; Danković, Danijel	Article	24M24
2023	Effects in Commercial p-Channel Power VDMOS Transistors Initiated by Negative Bias Temperature Stress and Irradiation	Veljković, Sandra ; Mitrović, Nikola ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Živanović, Emilija ; Stanković, Srboljub ; Anđelković, Marko ; Ristić, Goran ; Paskleva, Albena; Spassov, Dentcho; Danković, Danijel ;	Conference Paper	Mp. category will be shown later
2022	Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress	Veljković, Sandra ; Mitrović, Nikola ; Davidović, Vojkan ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Paskaleva, Albena; Spassov, Dencho; Stanković, Srboljub ; Andjelković, Marko ; Prijić, Zoran ; Manić, Ivica ; Prijić, Aneta ; Ristić, Goran ; Danković, Danijel ;	Article	22M22
2022	P-channel power VDMOSFETs under the influence of radiation and static/pulsed NBT stress	Veljković, Sandra ; Mitrović, Nikola ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Golubović, Snežana ; Prijić, Aneta ; Prijić, Zoran ; Ristić, Goran ; Danković, Danijel	Conference Paper	Mp. category will be shown later
2021	Gate oxide degradation of electronic components due to irradiation and bias temperature stress	Veljković, Sandra ; Mitrović, Nikola ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Golubović, Snežana ; Danković, Danijel	Conference Paper	Mp. category will be shown later
2021	Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors	Veljković, Sandra ; Mitrović, Nikola ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Golubović, Snežana ; Paskaleva, Albena; Spassov, Dentcho; Prijić, Zoran ; Prijić, Aneta ; Stanković, S. ; Danković, Danijel ;	Conference Paper	Mp. category will be shown later
2018	A review of pulsed NBTI in P-channel power VDMOSFETs	Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Davidović, Vojkan ; Prijić, Zoran ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Paskaleva, A.; Spassov, D.; Stojadinović, Ninoslav	Reviews	22M22
2018	NBT stress and radiation related degradation and underlying mechanisms in power VDMOSFETs	Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Đorić Veljković, Snežana ; Manić, Ivica ; Prijić, Zoran ; Prijić, Aneta ; Stojadinović, Ninoslav ; Stankovic, Srboljub	Naučni članak	24M24 - Vodeći nacionalni časopis kategorije M24
2018	Elektrohemijski procesi kod p-kanalnih VDMOS tranzistora snage pri sukcesivnom NBT naprezanju i ozračivanju	Davidović, Vojkan S. ; Danković, Danijel M. ; Golubović, Snežana M. ; Đorić-Veljković, Snežana M. ; Ivica Manić ; Prijić, Zoran D. ; Prijić, Aneta P. ; Stojadinović, Ninoslav D.	Konferencijski rad	Mp kategorija će biti prikazana naknadno.
2018	NBTI and irradiation related degradation mechanisms in power VDMOS transistors	Stojadinović, Ninoslav ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Stanković, Srboljub ; Prijić, Aneta ; Prijić, Zoran ; Manić, Ivica ; Danković, Danijel	Article	22M22
2018	Effects of consecutive irradiation and bias temperature stress in p-channel power vertical double-diffused metal oxide semiconductor transistors	Davidović, Vojkan ; Danković, Danijel ; Ilić, Aleksandar; Manić, Ivica ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Prijić, Zoran ; Prijić, Aneta ; Stojadinović, Ninoslav	Article	22M22
2017	Ispitivanje višeslojnih HfO2/Al2O3 struktura za memorijske komponente	Davidović, Vojkan S. ; A. Paskaleva; D. Spassov; E. Guziewicz; T. Krajewski; Golubović, Snežana M. ; Đorić-Veljković, Snežana M. ; Manić, Ivica Đ. ; Danković, Danijel M. ; Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2017	Electrical and Charge Trapping Properties of HfO2/Al2O3 Multilayer Dielectric Stacks	Davidović, Vojkan S. ; A. Paskaleva; D. Spassov; E. Guziewicz; T. Krajewski; Golubović, Snežana M. ; Đorić-Veljković, Snežana M. ; Manić, Ivica Đ. ; Danković, Danijel M. ; Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2017	Modelling of Threshold Voltage Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs	Danković, Danijel M. ; Manić, Ivica Đ. ; Stojadinović, Ninoslav D. ; Prijić, Zoran D. ; Đorić-Veljković, Snežana M. ; Davidović, Vojkan S. ; Prijić, Aneta P. ; A. Paskaleva; D. Spassov; Golubović, Snežana B.	Conference Paper	Mp. category will be shown later
2016	On the Recoverable and Permanent Components of NBTI in p-Channel Power VDMOSFETs	Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Marjanović, Miloš ; Ilic, Aleksandar; Prijić, Zoran ; Stojadinović, Ninoslav	Article	21M21
2016	NBTI and Irradiation Effects in P-Channel Power VDMOS Transistors	Davidović, Vojkan ; Danković, Danijel ; Ilic, Aleksandar; Manić, Ivica ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	21M21
2016	Effects of pulsed negative bias temperature stressing in p-channel power VDMOSFETs	Manić, Ivica ; Danković, Danijel ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	24M24
2015	Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation	Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Stojadinović, Ninoslav ; Prijić, Zoran ; Golubović, Snežana	Article	21M21
2015	Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET	Danković, Danijel ; Stojadinović, Ninoslav ; Prijić, Zoran ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana	Article	22M22
2015	Annealing influence on recovery of electrically stressed power vertical double-diffused metal oxide semiconductor transistors	Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav	Article	22M22