Stojadinović, Ninoslav

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Results 21-40 of 81 Results/Page

Issue Date	Title	Author(s)	Type	Мp-cat.
2015	Annealing influence on recovery of electrically stressed power vertical double-diffused metal oxide semiconductor transistors	Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav	Article	22M22
2015	Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation	Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Stojadinović, Ninoslav ; Prijić, Zoran ; Golubović, Snežana	Article	21M21
2015	Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET	Danković, Danijel ; Stojadinović, Ninoslav ; Prijić, Zoran ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana	Article	22M22
2015	Modeling and PSPICE Simulation of Radiation Stress Influence on Threshold Voltage Shifts in P-Channel Power VDMOS Transistors	Marjanović, Miloš ; Danković, Danijel ; Davidović, Vojkan ; Prijić, Aneta ; Stojadinović, Ninoslav D. ; Prijić, Zoran ; Janković, Nebojša D.	Conference Paper	Mp. category will be shown later
2014	Recoverable and permanent components of V<inf>T</inf> shift in pulsed NBT stressed p-channel power VDMOSFETs	Danković, Danijel ; Stojadinović, Ninoslav ; Prijić, Zoran ; Manić, Ivica ; Prijić, Aneta	Conference Paper	Mp. category will be shown later
2014	Mobilna eksperimentalna postavka za određivanje napona praga VDMOS tranzistora snage	Aleksandar Ilić; Prijić, Zoran ; Prijić, Aneta ; Davidović, Vojkan ; Danković, Danijel ; Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2014	Recoverable and Permanent Components of V-T Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs	Danković, Danijel ; Stojadinović, Ninoslav ; Prijić, Zoran ; Manić, Ivica ; Prijić, Aneta	Conference Paper	Mp. category will be shown later
2014	A Method for Measuring NBTI Degradation in p-channel Power VDMOSFETs	Prijić, Zoran ; Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2014	Measurement of NBTI Degradation in p-channel Power VDMOSFETs	Manić, Ivica Đ. ; Danković, Danijel ; Prijić, Aneta ; Prijić, Zoran ; Stojadinović, Ninoslav D.	Article	23M23
2014	Recovery Treatment Effects on Gamma Radiation Response in Electrically Stressed Power VDMOS Transistors	Đorić-Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Manić, Ivica ; Golubović, Snežana ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2014	Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors	Stojadinović, Ninoslav ; Manić, Ivica ; Danković, Danijel ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Prijić, Aneta ; Golubović, Snežana ; Prijić, Zoran	Book parts	Mp. category will be shown later
2013	The Comparison of Gamma-Radiation and Electrical Stress Influences on Oxide and Interface Defects in Power Vdmosfet	Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav	Article	22M22
2013	Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs	Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	23M23
2013	Naponsko temperaturna naprezanja p-kanalnih VDMOS tranzistora snage	Danković, Danijel ; Prijić, Aneta ; Manić, Ivica Đ. ; Prijić, Zoran ; Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2013	Time-dependent dielectric breakdown in pure and lightly Al-doped Ta2O5 stacks	Elena Atanassova; Stojadinović, Ninoslav ; Dencho Spassov; Manić, Ivica ; Albena Paskaleva	Article	21M21
2013	Uticaj odžarivanja na oporavak električno naprezanih p-kanalnih VDMOS tranzistora snage	Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2012	Nova metoda za ispitivanje nestabilnosti usled naponsko temperaturnih naprezanja VDMOS tranzistora snage	Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Vračar, Ljubomir M. ; Prijić, Zoran ; Stojadinović, Ninoslav	Technical reports	Mp. category will be shown later
2012	Measurements of Negative Bias Temperature Instability (NBTI) in p-Channel Power VDMOSFETs	Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Prijić, Zoran ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2012	Određivanje perioda pouzdanog rada p-kanalnih VDMOS tranzistora snage podvrgnutih kontinualnim i impulsnim NBT naprezanjima	Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Davidović, Vojkan ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav ; Đorić-Veljković, Snežana	Conference Paper	Mp. category will be shown later
2012	Lifetime estimation in nbt-stressed p-channel power VDMOSFETS	Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	53M53