Researchers
Veljković, Sandra
Results 21-40 of 155
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2025 | Stress-induced degradation and lifetime estimation in commercial power VDMOS transistors | Danković, Danijel; Mitrović, Nikola   ; Veljković, Sandra ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan | Conference Paper | Mp. category will be shown later |
| 2025 | Impact of NBTS and Thermal Relaxation on Characteristic of CMOS Inverter | Veselinović, Nevena; Petrović, Marija; Đorđević, Dunja; Tasić, Lana; Mitrović, Nikola ; Veljković, Sandra ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2025 | Recovery Behavior of VDMOS Transistors under Sequential Irradiation and NBT Stress | Đorić-Veljković, Snežana ; Živanović, Emilija ; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Ristić, Goran ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2025 | Proposal of Dual-Gate Oxide Layered with HfO2: Comparative Results with SiO2-RadFET | Yilmaz, Ercan; Ristić, Goran ; Turan, Rasit; Yilmaz, Ozan; Gurer, Umutcan; Danković, Danijel ; Budak, Erhan; Marjanović, Miloš ; Veljković, Sandra ; Mutale, Alex;
Kahraman, Aysegul;
| Article | 21aM21a |
| 2025 | Experimental and SPICE-Based Modeling of NBTI and SHE in Power P-Channel VDMOS Transistors | Tasić, Lana; Veselinović, Nevena; Petrović, Marija; Đorđević, Dunja; Marjanović, Miloš ; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Živanović, Emilija ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2025 | Influence of Magnetic Field on Commercial P-Channel VDMOSFETs | Mitrović, Nikola ; Veljkovic, Sandra ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel | Contribution to periodical | Mp. category will be shown later |
| 2024 | SPICE modeling and simulation of RADFETs | Marjanović, Miloš ; Gurer, U.; Doganci, E.; Veljković, Sandra ; Ilić, S.; Mitrović, Nikola ; Danković, Danijel ; Yilmaz, E. | Conference Paper | Mp. category will be shown later |
| 2024 | Design and testing of low-cost portable magnetometer for consumer applications | Mitrović, Nikola ; Veljković, Sandra ; Prijić, Zoran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2024 | Successive irradiation and bias temperature stress induced effects on commercial p-channel power VDMOS transistors | Veljković, Sandra ; Mitrović, Nikola ; Davidović, Vojkan ; Živanović, Emilija ; Ristić, Goran ; Danković, Danijel | Article | 23M23 |
| 2024 | Modified SPICE-Compatible Model Integrating NBTI and Self-Heating Effects for VDMOS Transistors | Marjanović, Miloš ; Veljković, Sandra ; Mitrović, Nikola ; Źivanović, Emilija ; Gavrić, Aleksandar ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2024 | Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors | Đorić Veljković, Snežana ; Živanović, Emilija ; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Ristić, Goran ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel | Article | 21M21 |
| 2024 | Laboratorijske vežbe iz oblasti mikroelektronike uvirtuelnoj realnosti | Gavrić, Aleksandar ; Mitrović, Nikola ; Živanović, Emilija ; Marjanović, Miloš ; Danković, Danijel ; Veljković, Sandra ; Danković, Milan; Stanimirović, Aleksandar ; Stoimenov, Leonid | Conference Paper | Mp. category will be shown later |
| 2024 | Stress-induced Degradations and Self-heating Effects in P-channel Power VDMOS Transistors | Veljković, Sandra ; Mitrović, Nikola ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2024 | The role of OLED devices in the development of smart cities | Đorić Veljković, Snežana ; Mitrović, Nikola ; Veljković, Sandra ; Davidović, Vojkan ; Živanović, Emilija ; Manić, Ivica ; Danković, Danijel | Article | 24M24 |
| 2024 | A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress | Živanović, Emilija ; Veljković, Sandra ; Mitrović, Nikola ; Jovanović, Igor ; Đorić Veljković, Snežana ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel | Article | 21M21 |
| 2024 | International Conference on Microelectronics | Veljković, Sandra ; Živanović, Emilija ; Davidović, Vojkan ; Danković, Danijel | Article | Mp. category will be shown later |
| 2024 | IEEE Region 8 Student and Young Professional kongres 2024 | Veljković, Sandra ; Marjanović, Miloš | Report works | Mp. category will be shown later |
| 2024 | The effects of NBT stressing on later operation of power VDMOS transistors under normal conditions | Veljkovic, Sandra ; Mitrović, Nikola ; Davidović, Vojkan ; Albena Paskaleva; Dencho Spassov; Jovanović, Igor ; Živanović, Emilija ; Ristić, Goran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2024 | Istorijat i razvoj elektronike u Nišu | Danković, Danijel ; Živanović, Emilija ; Marjanović, Miloš ; Veljkovic, Sandra ; Mitrović, Nikola | Conference Paper | Mp. category will be shown later |
| 2024 | Impact of Trapped Charge on the Breakdown Phenomena in HfO2/Al2O3 — Based Memory Capacitors | Spassov, D.; Paskaleva, A.; Guziewicz, E.; Ivanov, Tz.; Stanchev, T.; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Danković, Danijel | Article | 22M22 |