Researchers



Results 21-40 of 155
Issue DateTitleAuthor(s)TypeМp-cat.
2025Investigation of NBTI and Relaxation Effects in P-Channel Power VDMOS TransistorsPetrović, Marija; Veselinović, Nevena; Tasić, Lana; Đorđević, Dunja; Veljković, Sandra  ; Mitrović, Nikola  ; Marjanović, Miloš  ; Živanović, Emilija  ; Danković, Danijel  Conference Paper
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2025Reliability of Gas-filled Surge Arresters Subjected to the Gamma RadiationŽivanović, Emilija  ; Veljković, Sandra  Contribution to periodical
Mp. category will be shown later
2025Influence of Pre-Stress Conditions on the Self-Heating Behavior of Power MOSFETsVeljković, Sandra  ; Mitrović, Nikola  ; Marjanović, Miloš  ; Živanović, Emilija  ; Davidović, Vojkan  ; Stanković, Srboljub  ; Ristić, Goran  ; Danković, Danijel  Conference Paper
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2025Investigation of the Self-Heating Effect in a P-Channel VDMOS Transistor under Dynamic Stress ConditionsĐorđević, Dunja; Veljkovic, Sandra  ; Ristić, Goran  Contribution to periodical
Mp. category will be shown later
2025Examination of TinyML Approach in ESP32-Based NFC ApplicationsMitrović, Nikola  ; Veljković, Sandra  ; Marjanović, Miloš  ; Živanović, Emilija  ; Andjelković, Marko ; Ristić, Goran  ; Danković, Danijel  Conference Paper
Mp. category will be shown later
2025Realizacija uređaja Kocka za društvene igreVeljković, Sandra  ; Vračar Zlatković, Jana  ; Branković, Neda  ; Stojković, Aleksandra  ; Mitrović, Nikola  ; Stojanović, Milan  ; Marjanović, Miloš  Conference Paper
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2024Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS TransistorsĐorić Veljković, Snežana  ; Živanović, Emilija  ; Davidović, Vojkan  ; Veljković, Sandra  ; Mitrović, Nikola  ; Ristić, Goran  ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel  Article
21M21
2024Laboratorijske vežbe iz oblasti mikroelektronike uvirtuelnoj realnostiGavrić, Aleksandar  ; Mitrović, Nikola  ; Živanović, Emilija  ; Marjanović, Miloš  ; Danković, Danijel  ; Veljković, Sandra  ; Danković, Milan; Stanimirović, Aleksandar  ; Stoimenov, Leonid  Conference Paper
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2024Assessment of NBT Stressing Impact on the Continuous Operation of Power VDMOS TransistorVeljković, Sandra  ; Mitrović, Nikola  ; Živanović, Emilija  ; Marjanović, Miloš  ; Davidović, Vojkan  ; Ristić, Goran  ; Danković, Danijel  Conference Paper
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2024Impact of Trapped Charge on the Breakdown Phenomena in HfO2/Al2O3 — Based Memory CapacitorsSpassov, D.; Paskaleva, A.; Guziewicz, E.; Ivanov, Tz.; Stanchev, T.; Davidović, Vojkan  ; Veljković, Sandra  ; Mitrović, Nikola  ; Danković, Danijel  Article
22M22
2024SPICE modeling and simulation of RADFETsMarjanović, Miloš  ; Gurer, U.; Doganci, E.; Veljković, Sandra  ; Ilić, S.; Mitrović, Nikola  ; Danković, Danijel  ; Yilmaz, E.Conference Paper
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2024Design and testing of low-cost portable magnetometer for consumer applicationsMitrović, Nikola  ; Veljković, Sandra  ; Prijić, Zoran  ; Danković, Danijel  Conference Paper
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2024International Conference on MicroelectronicsVeljković, Sandra  ; Živanović, Emilija  ; Davidović, Vojkan  ; Danković, Danijel  Article
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2024A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature StressŽivanović, Emilija  ; Veljković, Sandra  ; Mitrović, Nikola  ; Jovanović, Igor  ; Đorić Veljković, Snežana  ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel  Article
21M21
2024IEEE Region 8 Student and Young Professional kongres 2024Veljković, Sandra  ; Marjanović, Miloš  Report works
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2024The effects of NBT stressing on later operation of power VDMOS transistors under normal conditionsVeljkovic, Sandra  ; Mitrović, Nikola  ; Davidović, Vojkan  ; Albena Paskaleva; Dencho Spassov; Jovanović, Igor  ; Živanović, Emilija  ; Ristić, Goran  ; Danković, Danijel  Conference Paper
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2024Istorijat i razvoj elektronike u NišuDanković, Danijel  ; Živanović, Emilija  ; Marjanović, Miloš  ; Veljkovic, Sandra  ; Mitrović, Nikola  Conference Paper
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2024Successive irradiation and bias temperature stress induced effects on commercial p-channel power VDMOS transistorsVeljković, Sandra  ; Mitrović, Nikola  ; Davidović, Vojkan  ; Živanović, Emilija  ; Ristić, Goran  ; Danković, Danijel  Article
23M23
2024Stress-induced Degradations and Self-heating Effects in P-channel Power VDMOS TransistorsVeljković, Sandra  ; Mitrović, Nikola  ; Marjanović, Miloš  ; Živanović, Emilija  ; Davidović, Vojkan  ; Ristić, Goran  ; Danković, Danijel  Conference Paper
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2024Modified SPICE-Compatible Model Integrating NBTI and Self-Heating Effects for VDMOS TransistorsMarjanović, Miloš  ; Veljković, Sandra  ; Mitrović, Nikola  ; Źivanović, Emilija  ; Gavrić, Aleksandar  ; Danković, Danijel  Conference Paper
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