Researchers
Davidović, Vojkan
Results 21-40 of 108
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2024 | Stress-induced Degradations and Self-heating Effects in P-channel Power VDMOS Transistors![]() | Veljković, Sandra | Conference Paper | Mp. category will be shown later |
| 2024 | The role of OLED devices in the development of smart cities![]() | Đorić Veljković, Snežana | Article | 24M24 |
| 2023 | Characterization of the Electric Breakdowns in Metal-Insulator-Silicon Capacitor Structures with HfO2/Al2O3 Layers for Non-Volatile Memory Applications![]() | Spassov, Dentcho; Paskaleva, Albena; Guziewicz, Elzbieta; Ivanov, Tz.; Stanchev, T.; Davidović, Vojkan | Conference Paper | Mp. category will be shown later |
| 2023 | Effects in Commercial p-Channel Power VDMOS Transistors Initiated by Negative Bias Temperature Stress and Irradiation![]() | Veljković, Sandra | Conference Paper | Mp. category will be shown later |
| 2023 | Threshold voltage shift in irradiated and pulsed NBT stressed p-channel VDMOS transistors![]() | Mitrović, Nikola | Conference Paper | Mp. category will be shown later |
| 2023 | Experimental setup and procedure for NBT stress and irradiation of VDMOS transistors![]() | Veljković, Sandra | Conference Paper | Mp. category will be shown later |
| 2022 | Characterization of irradiated and NBT stressed p-channel power VDMOSFETs![]() | Mitrović, Nikola | Conference Paper | Mp. category will be shown later |
| 2022 | Radiation and pulsed NBTS induced threshold voltage shift in p-channel power VDMOSFETs![]() | Mitroviћ, Nikola | Conference Paper | Mp. category will be shown later |
| 2022 | Impact of negative bias temperature instability on p-channel power VDMOSFET used in practical applications![]() | Mitrović, Nikola | Article | 22M22 |
| 2022 | P-channel power VDMOSFETs under the influence of radiation and static/pulsed NBT stress![]() | Veljković, Sandra | Conference Paper | Mp. category will be shown later |
| 2022 | Response of Commercial P-Channel Power VDMOS Transistors to Ionizing Irradiation and Bias Temperature Stress![]() | Veljković, Sandra | Article | 22M22 |
| 2021 | Efekti zračenja i odžarivanja kod naponsko temperaturno naprezanih p-kanalnih VDMOS tranzistora snage![]() | Veljković, Sandra | Conference Paper | Mp. category will be shown later |
| 2021 | Gate oxide degradation of electronic components due to irradiation and bias temperature stress![]() | Veljković, Sandra | Conference Paper | Mp. category will be shown later |
| 2021 | Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors![]() | Veljković, Sandra | Conference Paper | Mp. category will be shown later |
| 2021 | Methods for modeling of NBTS induced threshold voltage shift in p-channel power VDMOSFETs![]() | Mitrović, Nikola | Conference Paper | Mp. category will be shown later |
| 2021 | A Review of the Electric Circuits for NBTI Modeling in p-Channel Power VDMOSFETs![]() | Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2021 | Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs![]() | Danković, Danijel | Article | 22M22 |
| 2021 | Radiation Tolerance and Charge Trapping Enhancement of ALD HfO2/Al2O3 Nanolaminated Dielectrics![]() | Spassov, Dencho; Paskaleva, Albena; Guziewicz, Elżbieta; Davidović, Vojkan | Article | 21aM21a |
| 2019 | Comparison of Radiation Characteristics of HfO2 and SiO2 Incorporated in MOS Capacitor in Field of Gamma and X Radiation![]() | Stanković, Srboljub J. | Conference Paper | Mp. category will be shown later |
| 2019 | Impact of γ Radiation on Charge Trapping Properties of Nanolaminated HfO2/Al2O3 ALD Stacks![]() | Spassov, Dentcho; Paskaleva, Albena; Davidović, Vojkan S. | Conference Paper | Mp. category will be shown later |
