Researchers
Mitrović, Nikola
Results 21-40 of 99
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2024 | SPICE modeling and simulation of RADFETs | Marjanović, Miloš   ; Gurer, U.; Doganci, E.; Veljković, Sandra ; Ilić, S.; Mitrović, Nikola ; Danković, Danijel ; Yilmaz, E. | Conference Paper | Mp. category will be shown later |
| 2024 | Impact of Trapped Charge on the Breakdown Phenomena in HfO2/Al2O3 — Based Memory Capacitors | Spassov, D.; Paskaleva, A.; Guziewicz, E.; Ivanov, Tz.; Stanchev, T.; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Danković, Danijel | Article | 22M22 |
| 2024 | Assessment of NBT Stressing Impact on the Continuous Operation of Power VDMOS Transistor | Veljković, Sandra ; Mitrović, Nikola ; Živanović, Emilija ; Marjanović, Miloš ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2024 | Design and testing of low-cost portable magnetometer for consumer applications | Mitrović, Nikola ; Veljković, Sandra ; Prijić, Zoran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2024 | Istorijat i razvoj elektronike u Nišu | Danković, Danijel ; Živanović, Emilija ; Marjanović, Miloš ; Veljkovic, Sandra ; Mitrović, Nikola | Conference Paper | Mp. category will be shown later |
| 2024 | Thermal annealing induced recovery of the VT of irradiated commercial MOS transistors | Mitrović, Nikola ; Guirado, Damian; Danković, Danijel ; Palma, Alberto; Ristić, Goran ; Carvajal, Miguel | Article | 22M22 |
| 2024 | A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress | Živanović, Emilija ; Veljković, Sandra ; Mitrović, Nikola ; Jovanović, Igor ; Đorić Veljković, Snežana ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel | Article | 21M21 |
| 2024 | Laboratorijske vežbe iz oblasti mikroelektronike uvirtuelnoj realnosti | Gavrić, Aleksandar ; Mitrović, Nikola ; Živanović, Emilija ; Marjanović, Miloš ; Danković, Danijel ; Veljković, Sandra ; Danković, Milan; Stanimirović, Aleksandar ; Stoimenov, Leonid | Conference Paper | Mp. category will be shown later |
| 2024 | Recovery Analysis of Sequentially Irradiated and NBT-Stressed VDMOS Transistors | Đorić Veljković, Snežana ; Živanović, Emilija ; Davidović, Vojkan ; Veljković, Sandra ; Mitrović, Nikola ; Ristić, Goran ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel | Article | 21M21 |
| 2024 | The effects of NBT stressing on later operation of power VDMOS transistors under normal conditions | Veljkovic, Sandra ; Mitrović, Nikola ; Davidović, Vojkan ; Albena Paskaleva; Dencho Spassov; Jovanović, Igor ; Živanović, Emilija ; Ristić, Goran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2024 | Successive irradiation and bias temperature stress induced effects on commercial p-channel power VDMOS transistors | Veljković, Sandra ; Mitrović, Nikola ; Davidović, Vojkan ; Živanović, Emilija ; Ristić, Goran ; Danković, Danijel | Article | 23M23 |
| 2024 | Stress-induced Degradations and Self-heating Effects in P-channel Power VDMOS Transistors | Veljković, Sandra ; Mitrović, Nikola ; Marjanović, Miloš ; Živanović, Emilija ; Davidović, Vojkan ; Ristić, Goran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2024 | Modified SPICE-Compatible Model Integrating NBTI and Self-Heating Effects for VDMOS Transistors | Marjanović, Miloš ; Veljković, Sandra ; Mitrović, Nikola ; Źivanović, Emilija ; Gavrić, Aleksandar ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2024 | The role of OLED devices in the development of smart cities | Đorić Veljković, Snežana ; Mitrović, Nikola ; Veljković, Sandra ; Davidović, Vojkan ; Živanović, Emilija ; Manić, Ivica ; Danković, Danijel | Article | 24M24 |
| 2023 | Lifetime estimation of p-channel power VDMOSFETs applied in automotive applications | Mitrović, Nikola ; Veljković, Sandra ; Prijić, Zoran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2023 | Self-heating of stressed VDMOS devices under specific operating conditions | Veljković, Sandra ; Mitrović, Nikola ; Jovanović, Igor ; Živanović, Emilija ; Paskaleva, A.; Spassov, D.; Mančić, Dragan ; Danković, Danijel | Article | 22M22 |
| 2023 | Effects in Commercial p-Channel Power VDMOS Transistors Initiated by Negative Bias Temperature Stress and Irradiation | Veljković, Sandra ; Mitrović, Nikola ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Živanović, Emilija ; Stanković, Srboljub ; Anđelković, Marko ; Ristić, Goran ; Paskleva, Albena;
Spassov, Dentcho; Danković, Danijel
; | Conference Paper | Mp. category will be shown later |
| 2023 | SPICE Modeling of RADFETs with Different Gate Oxide Thicknesses | Marjanović, Miloš ; Gürer, U.; Mitrović, Nikola ; Yilmaz, O.; Danković, Danijel ; Budak, E.; Ristić, Goran ; Yilmaz, Ercan | Conference Paper | Mp. category will be shown later |
| 2023 | Effects of self-heating and NBTI-induced stress on p-channel power VDMOSFETs | Veljković, Sandra ; Mitrović, Nikola ; Jovanović, Igor ; Živanović, Emilija ; Paskaleva, Albena; Ristić, Goran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2023 | Implementation and Testing of WebSocket Protocol in ESP32 based IoT Systems | Mitrović, Nikola ; Đorđević, Milan; Veljković, Sandra ; Danković, Danijel | Article | 23M23 |